Numerous　non-volatile　reconfigurable　photonic　devices　based　on　phase　change　materials　have　been　proposed　and　applied　to　photonic　integrated　circuits.　However,　the　unstable　states　of　the　devices　after　crystallization　and　amorphization　excitation　in　these　studies　have　not　been　investigated　and　discussed.　In　this　work,　a　non-volatile　reconfigurable　photonic　device　is　fabricated　to　estimate　its　stability.　Under　electrical　pulse　excitation,　the　device＇s　output　optical　power　can　switch　between　two　states　with　an　extinction　ratio　of　15　dB.　The　results　reveal　that　it　takes　some　time　for　the　device　to　reach　a　relatively　stable　state　after　excitation,　and　both　pulse　waveform　and　ambient　temperature　affect　the　stability　of　the　device　state.　Therefore,　it　is　of　great　significance　to　draw　attention　to　improve　the　practical　reliability　of　non-volatile　reconfigurable　photonic　devices.