Ptychography　offers　several　advantages,　including　a　lensless　design,　a　simple　optical　setup,　high　spatial　resolution,　and　the　elimination　of　the　need　for　high-quality　optical　components.　In　applications　like　surface　topography　measurement,　ptychography　setups　are　typically　configured　in　reflective　mode.　However,　existing　studies　indicate　that　normal-incidence　configurations　are　often　complex　and　constrained　by　the　arrangement　of　beam　splitters.　Furthermore,　tilted　illumination　with　vertical　detection　typically　involves　tilted　plane　correction　methods　for　pre-correcting　diffraction　patterns　or　by　developing　more　refined　models,　which　can　degrade　reconstruction　accuracy　and　increase　computational　overhead.　This　study　derives　a　forward　propagation　model　for　reflective　off-axis　diffraction,　where　the　beam　maintains　the　same　angle　relative　to　both　the　sample　plane　and　the　recording　plane,　thereby　eliminating　the　need　for　a　pre-correction　process.　Based　on　our　propagation　model,　we　developed　a　regularized　ptychography　iterative　engine　combined　with　a　total　variation　denoising　algorithm,　effectively　suppressing　sensor　noise　and　potential　experimental　inaccuracies.　Reflective　samples　were　successfully　reconstructed,　and　comparisons　with　pre-correction　methods　on　USAF　1951　targets　demonstrated　a　significant　improvement　in　reconstruction　speed　as　well　as　enhanced　accuracy.　Finally,　the　proposed　method　accurately　retrieved　the　surface　morphology　of　atomic　force　microscope　test　samples.