Microstructures　significantly　influence　the　physical　properties　of　materials.　Characterizing　the　evolution　of　materials＇　microstructures　is　helpful　for　exploring　the　processing　techniques　and　understanding　the　thermodynamic　properties　of　materials.　However,　the　in-situ　experiments　based　on　the　scanning　electron　microscope　(SEM)　often　suffer　from　non-uniform　image　drift　distortion,　which　severely　interferes　with　the　imaging　and　characterization.　Therefore,　in　this　study,　we　develop　an　external　scanning　and　imaging　system　for　dynamic　image　drift　compensation　during　the　in-situ　SEM　experiments.　The　drifted　image　was　dynamically　corrected　to　the　center　of　view　by　changing　the　path　of　the　electron　beams.　The　proposed　method　was　compared　with　three　conventional　image　correction　methods　to　validate　its　effectiveness　in　two　scenarios,　i.e.,　in-situ　translation　experiment　and　in-situ　heating　experiment.　The　results　showed　that　the　image　registration　technique　combined　with　the　electron　beam　trajectory　correction　effectively　compensated　the　image　drift　caused　by　irregular　sample　motion.　Compared　with　existing　image　post-processing　methods,　we　have　achieved　real-time　drift　compensation　of　the　images.　For　the　secondary　electron　(SE)　image　with　a　resolution　of　1024　×　1024　pixels　compensated　based　on　the　method　proposed　in　this　paper,　the　maximum　pixel　loss　within　the　field　of　view　is　only　3　pixels.　This　technology　can　effectively　correct　image　drift　caused　by　high　temperatures　during　the　in-situ　progress,　thereby　helping　material　characterization.　©　2025　Elsevier　Ltd