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Author:

Jiao, Jing-Pin (Jiao, Jing-Pin.) (Scholars:焦敬品) | Zeng, Xian-Chao (Zeng, Xian-Chao.) | Liu, Wen-Hua (Liu, Wen-Hua.) | He, Cun-Fu (He, Cun-Fu.) (Scholars:何存富) | Wu, Bin (Wu, Bin.)

Indexed by:

EI Scopus PKU CSCD

Abstract:

The non-perfection of contacting interfaces causes the non-trivial features including the contact acoustic nonlinearity (CAN) for ultrasound propagating through the interface. A simple model for one-dimensional longitudinal wave transmission through non-perfect interfaces is proposed, and the transmission coefficient is used to show the interface stiffness. Ultrasonic transmission experiments are carried out to investigate the contact state of the interface under different pressures, and the power-law relationship between the pressure and the stiffness coefficients is established by best fitting the measured ultrasound data. Results show that it is feasible to characterize the pressure-applied interfaces by using the transmission coefficients of the first and second order harmonics in transmitted ultrasonic waves.

Keyword:

Ultrasonic testing Wave transmission Interfaces (materials) Interface states Stiffness

Author Community:

  • [ 1 ] [Jiao, Jing-Pin]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Zeng, Xian-Chao]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [Liu, Wen-Hua]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 4 ] [He, Cun-Fu]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 5 ] [Wu, Bin]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China

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Source :

Journal of Beijing University of Technology

ISSN: 0254-0037

Year: 2012

Issue: 6

Volume: 38

Page: 807-812

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 6

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