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Author:

Gong, Yu (Gong, Yu.) | Tan, Bo-Tao (Tan, Bo-Tao.) | Song, Guo-Rong (Song, Guo-Rong.) | Lü, Yan (Lü, Yan.) | He, Cun-Fu (He, Cun-Fu.) (Scholars:何存富)

Indexed by:

EI Scopus PKU CSCD

Abstract:

The V(f, z) analytical method is an analytical method of frequency domain, and can be applied to measure the elastic constants of the smaller-specimen materials. Based on the technology of acoustic microscope, the line focus polyvinylidend fluoride (PVDF) transducer was applied to measure the longitudinal wave. The surface wave velocity could be got by the V(f, z) analytical method, then the elastic constants were calculated. Elastic constants of the stainless steel were measured, and results were consistent with theoretical values. The error analysis shows that this method has a higher accuracy and the errors of Poisson's ratio and Young's modulus is within 5%, which means that this method can meet the need of engineering and scientific research. Moreover, this method can be used to measure the thin plate and coating materials, which lays the foundation for further measuring the elastic constants of thin plate and coating materials.

Keyword:

Wave propagation Frequency domain analysis Elastic constants Error analysis Surface waves Plating Elastic moduli Transducers Coatings Fluorine compounds

Author Community:

  • [ 1 ] [Gong, Yu]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Tan, Bo-Tao]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [Song, Guo-Rong]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 4 ] [Lü, Yan]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 5 ] [He, Cun-Fu]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China

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Source :

Journal of Beijing University of Technology

ISSN: 0254-0037

Year: 2012

Issue: 9

Volume: 38

Page: 1298-1301

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 6

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