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Author:

Cui, Ling-Li (Cui, Ling-Li.) (Scholars:崔玲丽) | Kang, Chen-Hui (Kang, Chen-Hui.) | Zhang, Jian-Yu (Zhang, Jian-Yu.) | Gao, Li-Xin (Gao, Li-Xin.) | Xu, Yong-Gang (Xu, Yong-Gang.)

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Abstract:

Based on basic principle of metal magnetic memory (MMM), this paper proposes a model of magnetic flux leakage signal of gear early local micro cracks. The tangential component of magnetic flux leakage signal will peak at the crack area while the normal component will pass zero point and its gradient has the peak. The effect of the crack depth on the characteristics has also been considered. The theory is then applied to detection of micro cracks on the tooth surface of an actual gear. The microscopic analysis results demonstrate the effectiveness of the magnetic memory testing.

Keyword:

Crack detection Magnetic leakage Magnetic storage Ferromagnetic materials Gears

Author Community:

  • [ 1 ] [Cui, Ling-Li]Key Laboratory of Advanced Manufacturing Technology, College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Kang, Chen-Hui]Key Laboratory of Advanced Manufacturing Technology, College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [Zhang, Jian-Yu]Key Laboratory of Advanced Manufacturing Technology, College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 4 ] [Gao, Li-Xin]Key Laboratory of Advanced Manufacturing Technology, College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 5 ] [Xu, Yong-Gang]Key Laboratory of Advanced Manufacturing Technology, College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China

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Source :

Journal of Beijing University of Technology

ISSN: 0254-0037

Year: 2012

Issue: 10

Volume: 38

Page: 1441-1445

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 7

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