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Author:

Dong, Yibo (Dong, Yibo.) | Guo, Sheng (Guo, Sheng.) | Mao, Huahai (Mao, Huahai.) | Xu, Chen (Xu, Chen.) (Scholars:徐晨) | Xie, Yiyang (Xie, Yiyang.) | Cheng, Chuantong (Cheng, Chuantong.) | Mao, Xurui (Mao, Xurui.) | Deng, Jun (Deng, Jun.) | Pan, Guanzhong (Pan, Guanzhong.) | Sun, Jie (Sun, Jie.)

Indexed by:

Scopus SCIE PubMed

Abstract:

Carbon solid solubility in metals is an important factor affecting uniform graphene growth by chemical vapor deposition (CVD) at high temperatures. At low temperatures, however, it was found that the carbon diffusion rate (CDR) on the metal catalyst surface has a greater impact on the number and uniformity of graphene layers compared with that of the carbon solid solubility. The CDR decreases rapidly with decreasing temperatures, resulting in inhomogeneous and multilayer graphene. In the present work, a Ni-Cu alloy sacrificial layer was used as the catalyst based on the following properties. Cu was selected to increase the CDR, while Ni was used to provide high catalytic activity. By plasma-enhanced CVD, graphene was grown on the surface of Ni-Cu alloy under low pressure using methane as the carbon source. The optimal composition of the Ni-Cu alloy, 1:2, was selected through experiments. In addition, the plasma power was optimized to improve the graphene quality. On the basis of the parameter optimization, together with our previously-reported, in-situ, sacrificial metal-layer etching technique, relatively homogeneous wafer-size patterned graphene was obtained directly on a 2-inch SiO2/Si substrate at a low temperature (similar to 600 degrees C).

Keyword:

chemical vapor deposition lithography-free insulating substrate graphene transfer-free low temperature growth

Author Community:

  • [ 1 ] [Dong, Yibo]Beijing Univ Technol, Coll Microelect, Key Lab Optoelect Technol, Beijing 100124, Peoples R China
  • [ 2 ] [Xu, Chen]Beijing Univ Technol, Coll Microelect, Key Lab Optoelect Technol, Beijing 100124, Peoples R China
  • [ 3 ] [Xie, Yiyang]Beijing Univ Technol, Coll Microelect, Key Lab Optoelect Technol, Beijing 100124, Peoples R China
  • [ 4 ] [Deng, Jun]Beijing Univ Technol, Coll Microelect, Key Lab Optoelect Technol, Beijing 100124, Peoples R China
  • [ 5 ] [Pan, Guanzhong]Beijing Univ Technol, Coll Microelect, Key Lab Optoelect Technol, Beijing 100124, Peoples R China
  • [ 6 ] [Sun, Jie]Beijing Univ Technol, Coll Microelect, Key Lab Optoelect Technol, Beijing 100124, Peoples R China
  • [ 7 ] [Guo, Sheng]Chalmers Univ Technol, Dept Ind & Mat Sci, S-41296 Gothenburg, Sweden
  • [ 8 ] [Mao, Huahai]KTH Royal Inst Technol, Mat Sci & Engn, Brinellvagen 23, S-10044 Stockholm, Sweden
  • [ 9 ] [Mao, Huahai]Thermocalc Software AB, Rasundavagen 18, S-16967 Solna, Sweden
  • [ 10 ] [Cheng, Chuantong]Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China
  • [ 11 ] [Mao, Xurui]Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China
  • [ 12 ] [Sun, Jie]Chalmers Univ Technol, Dept Microtechnol & Nanosci, Quantum Device Phys Lab, S-41296 Gothenburg, Sweden

Reprint Author's Address:

  • 徐晨 孙捷

    [Xu, Chen]Beijing Univ Technol, Coll Microelect, Key Lab Optoelect Technol, Beijing 100124, Peoples R China;;[Sun, Jie]Beijing Univ Technol, Coll Microelect, Key Lab Optoelect Technol, Beijing 100124, Peoples R China;;[Sun, Jie]Chalmers Univ Technol, Dept Microtechnol & Nanosci, Quantum Device Phys Lab, S-41296 Gothenburg, Sweden

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Source :

NANOMATERIALS

Year: 2019

Issue: 11

Volume: 9

5 . 3 0 0

JCR@2022

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:211

JCR Journal Grade:2

Cited Count:

WoS CC Cited Count: 10

SCOPUS Cited Count: 11

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 12

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