• Complex
  • Title
  • Keyword
  • Abstract
  • Scholars
  • Journal
  • ISSN
  • Conference
搜索

Author:

Cui, Desheng (Cui, Desheng.) | Guo, Weiling (Guo, Weiling.) | Cui, Bifeng (Cui, Bifeng.) | Ding, Tianping (Ding, Tianping.) | Yin, Fei (Yin, Fei.) | Yan, Weiwei (Yan, Weiwei.)

Indexed by:

EI Scopus PKU CSCD

Abstract:

High-power blue light-emitting diodes were biased by negative Human-Body-Mode electrostatic discharge(ESD) with -200, -400, -600, -800, -1100 and -1500 V. The electrical and optical parameters of the LED were measured before and after ESD stressing. The failure mechanisms resulted in by ESD stress were analysised after each ESD stress. The LED had evident soft breakdown due to the generation of defect in active region and cladding layers after ESD stressing at -200, -400, -600 and -800 V. However, when the device was biased to -1100 V and -1500 V, high leakage current of the LED appears and 50% degradation of light output than before stressing. The reason is the generation of melting thread in active region that made LED cannot emit light. In addition, a simple and effective protection circuit for ESD is proposed.

Keyword:

Optical devices III-V semiconductors Failure (mechanical) Electrostatic devices Diodes Light emitting diodes Gallium nitride Degradation Electrostatics

Author Community:

  • [ 1 ] [Cui, Desheng]Key Laboratory of Opto-Electronics Technology, Ministry of Education, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Guo, Weiling]Key Laboratory of Opto-Electronics Technology, Ministry of Education, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [Cui, Bifeng]Key Laboratory of Opto-Electronics Technology, Ministry of Education, Beijing University of Technology, Beijing 100124, China
  • [ 4 ] [Ding, Tianping]Key Laboratory of Opto-Electronics Technology, Ministry of Education, Beijing University of Technology, Beijing 100124, China
  • [ 5 ] [Yin, Fei]Key Laboratory of Opto-Electronics Technology, Ministry of Education, Beijing University of Technology, Beijing 100124, China
  • [ 6 ] [Yan, Weiwei]Key Laboratory of Opto-Electronics Technology, Ministry of Education, Beijing University of Technology, Beijing 100124, China

Reprint Author's Address:

Show more details

Related Keywords:

Source :

Acta Optica Sinica

ISSN: 0253-2239

Year: 2011

Issue: 3

Volume: 31

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 5

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 8

Online/Total:389/10633411
Address:BJUT Library(100 Pingleyuan,Chaoyang District,Beijing 100124, China Post Code:100124) Contact Us:010-67392185
Copyright:BJUT Library Technical Support:Beijing Aegean Software Co., Ltd.