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Author:

Chen, Dai-Xie (Chen, Dai-Xie.) | Chu, Ming-Zhang (Chu, Ming-Zhang.) | Lin, Yun-Sheng (Lin, Yun-Sheng.) | Han, Li (Han, Li.) | Zhang, Yue-Fei (Zhang, Yue-Fei.) (Scholars:张跃飞) | Mao, Sheng-Cheng (Mao, Sheng-Cheng.) (Scholars:毛圣成)

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EI Scopus PKU CSCD

Abstract:

To deal with the problem of large system error of the micro-tensile stage and improve its measurement accuracy, several data processing methods are studied in this paper. Through the design of high speed and high accuracy data acquisition system, comparing the linear regression, polynomial fitting, subsection fitting and point-by-point comparison methods, the author can get the advantages and disadvantages of these methods in system error correction. All data processing methods can be realized by VC++ programming and also can be dealt on line. Experimental results show that flexible use of these methods can effectively improve the measurement accuracy for the micro-tensile stage.

Keyword:

Error correction Data handling Data acquisition Data processing

Author Community:

  • [ 1 ] [Chen, Dai-Xie]Graduate University of Chinese Academy of Sciences, Beijing 100049, China
  • [ 2 ] [Chen, Dai-Xie]Micro and Nano Fabrication Laboratory, Institute of Electrical Engineering of Chinese Academy of Sciences, Beijing 100190, China
  • [ 3 ] [Chu, Ming-Zhang]Micro and Nano Fabrication Laboratory, Institute of Electrical Engineering of Chinese Academy of Sciences, Beijing 100190, China
  • [ 4 ] [Lin, Yun-Sheng]Micro and Nano Fabrication Laboratory, Institute of Electrical Engineering of Chinese Academy of Sciences, Beijing 100190, China
  • [ 5 ] [Han, Li]Micro and Nano Fabrication Laboratory, Institute of Electrical Engineering of Chinese Academy of Sciences, Beijing 100190, China
  • [ 6 ] [Zhang, Yue-Fei]Institute of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing 100124, China
  • [ 7 ] [Mao, Sheng-Cheng]Institute of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing 100124, China

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Source :

Journal of Beijing University of Technology

ISSN: 0254-0037

Year: 2011

Issue: 8

Volume: 37

Page: 1205-1211

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 11

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