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Author:

Chen, Zhenhua (Chen, Zhenhua.) | Shi, Yaowu (Shi, Yaowu.) | Zhao, Haiyan (Zhao, Haiyan.) | Wang, Yan (Wang, Yan.) | Zhang, Ning (Zhang, Ning.)

Indexed by:

EI Scopus PKU CSCD

Abstract:

The higher order harmonic component of nonlinear ultrasonic is obtained by the general ultrasonic testing device with a higher pass filter, and the higher order harmonic wave is adopted into the tiny flaw detection and the ultrasonic imaging of spot welds. The higher order harmonic wave has excellent sensitivity to the tiny flaw and higher resolution in the time domain than conventional ultrasonic wave. Thus, the size and the position of tiny flaw are easier to determine, though the thickness of spot weld is very small. Besides, the nonlinear ultrasonic imaging technique based on the higher order harmonic wave is also presented in the research, and the nonlinear ultrasonic imaging is more effective to investigate the inner constitution of spot weld. The nonlinear ultrasonic has a higher testing effectiveness, and the testing ability of ultrasonic system can be developed. © Right.

Keyword:

Ultrasonic testing Imaging systems Spot welding Ability testing Welds Harmonic analysis Ultrasonic imaging

Author Community:

  • [ 1 ] [Chen, Zhenhua]School of Materials Science and Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Shi, Yaowu]School of Materials Science and Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [Zhao, Haiyan]Department of Mechanical Engineering, Tsinghua University, Beijing 100084, China
  • [ 4 ] [Wang, Yan]School of Materials Science and Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 5 ] [Zhang, Ning]School of Materials Science and Engineering, Beijing University of Technology, Beijing 100124, China

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Source :

Acta Acustica

ISSN: 0371-0025

Year: 2010

Issue: 1

Volume: 35

Page: 9-13

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 14

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