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Author:

Cui, Lingli (Cui, Lingli.) (Scholars:崔玲丽) | Kang, Chenhui (Kang, Chenhui.) | Xu, Yonggang (Xu, Yonggang.) | Gao, Lixin (Gao, Lixin.)

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Abstract:

Aiming at the difficulty of early weak impactive fault feature extraction of roller bearings, an integrated algorithm based on resonance demodulation method and entropy threshold denoising of wavelet packet coefficients is proposed to accurately determine the resonance modulation bands resulted by early weak impactive fault signals. Firstly, the algorithm uses delayed correlation pretreatment and entropy threshold arithmetic of wavelet packet coefficients to realize double noise reduction of the signals. In the algorithm, the optimal decomposition scale of wavelet packet decomposition and optimal entropy threshold are chosen based on resonance band energy ratio to locate the best solution of resonance bands. Then resonance demodulation is applied to the best resonance bands to extract the fault signal feature. Experiment data analysis results prove the validity and practicability of the proposed method for early weak impactive fault feature extraction of roller bearings.

Keyword:

Resonance Feature extraction Roller bearings Wavelet decomposition Extraction Optical variables measurement Demodulation Wavelet analysis Entropy

Author Community:

  • [ 1 ] [Cui, Lingli]The Key Laboratory of Advanced Manufacturing Technology, College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Kang, Chenhui]The Key Laboratory of Advanced Manufacturing Technology, College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [Xu, Yonggang]The Key Laboratory of Advanced Manufacturing Technology, College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 4 ] [Gao, Lixin]The Key Laboratory of Advanced Manufacturing Technology, College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China

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Source :

Chinese Journal of Scientific Instrument

ISSN: 0254-3087

Year: 2010

Issue: 11

Volume: 31

Page: 2422-2427

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 10

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