• Complex
  • Title
  • Keyword
  • Abstract
  • Scholars
  • Journal
  • ISSN
  • Conference
搜索

Author:

Jin, Dong-Yue (Jin, Dong-Yue.) | Zhang, Wan-Rong (Zhang, Wan-Rong.) | Xie, Hong-Yun (Xie, Hong-Yun.) | Shen, Pei (Shen, Pei.) | Wang, Yang (Wang, Yang.)

Indexed by:

EI Scopus PKU CSCD

Abstract:

In order to improve the thermal stability of RF power HBT and eliminate the self-heating effect which degenerates the transistor's electrical characteristics, the physical significance of thermal stability factor S is presented in detail based on the thermal-electric feedback network analysis. Furthermore, the expression of the minimum ballasting resistance RC of HBT to compensate the self-heating effect (S=0) is presented by taking into account of the temperature dependence of emitter current, the valence-band discontinuity at emitter junction (ΔEv), the bandgap narrowing due to heavy doping (ΔEg), additional ballasting resistance in emitter and base. It is found that the higher the temperature T is, the smaller the minimum ballasting resistance RC to compensate the self-heating effect is under the condition that (ΔEv+ΔEg)>2KT. Owing to the reducing of ballasting resistance, RF power HBT will provide higher output power, power gain, and power-added efficiency (PAE) in an amplifier block.

Keyword:

Valence bands Energy gap Feedback Heterojunction bipolar transistors Thermodynamic stability Electric network analysis Heating

Author Community:

  • [ 1 ] [Jin, Dong-Yue]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 2 ] [Zhang, Wan-Rong]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 3 ] [Xie, Hong-Yun]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 4 ] [Shen, Pei]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 5 ] [Wang, Yang]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China

Reprint Author's Address:

Email:

Show more details

Related Keywords:

Source :

Journal of Beijing University of Technology

ISSN: 0254-0037

Year: 2008

Issue: 2

Volume: 34

Page: 141-144,149

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 6

Online/Total:385/10637842
Address:BJUT Library(100 Pingleyuan,Chaoyang District,Beijing 100124, China Post Code:100124) Contact Us:010-67392185
Copyright:BJUT Library Technical Support:Beijing Aegean Software Co., Ltd.