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Author:

Zhang, Xiaokang (Zhang, Xiaokang.) | Deng, Jinxiang (Deng, Jinxiang.) (Scholars:邓金祥) | Wang, Ling (Wang, Ling.) | Wang, Xuyang (Wang, Xuyang.) | Yao, Qian (Yao, Qian.) | Chen, Guanghua (Chen, Guanghua.) | He, Deyan (He, Deyan.)

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Abstract:

Two groups of RF-sputtered BN films (pure hexagonal phase and approximately 27.5% cubic content, respectively) were annealed at 600 to 1000 °C under nitrogen at atmospheric pressure after deposition. FTIR spectroscopy indicates a reversible transformation from hexagonal phase to cubic phase, and again hexagonal phase. The most effective temperature for h-BN converting to cubic zincblende (c-BN) is 900 °C. Further, the indirectly stepwise transformation from hexagonal (h-BN) to explosive BN (E-BN) and then to c-BN employing metastable E-BN as an intermedium was observed. In addition, we tentatively put forward that the existence of defective h-BN and the N defects plays a key role on h-BN to c-BN transformation. © 2008 Elsevier B.V. All rights reserved.

Keyword:

Phase transitions III-V semiconductors Atmospheric pressure Annealing Defects Boron nitride Nitrogen Fourier transform infrared spectroscopy Cubic boron nitride Zinc sulfide

Author Community:

  • [ 1 ] [Zhang, Xiaokang]School of Physical Science and Technology, Lanzhou University, Lanzhou, 730000, China
  • [ 2 ] [Deng, Jinxiang]School of Applied Mathematics and Physics, Beijing University of Technology, Beijing, 100022, China
  • [ 3 ] [Wang, Ling]School of Applied Mathematics and Physics, Beijing University of Technology, Beijing, 100022, China
  • [ 4 ] [Wang, Xuyang]School of Applied Mathematics and Physics, Beijing University of Technology, Beijing, 100022, China
  • [ 5 ] [Yao, Qian]School of Applied Mathematics and Physics, Beijing University of Technology, Beijing, 100022, China
  • [ 6 ] [Chen, Guanghua]The Key Laboratory of Advanced Functional Materials, Ministry of Education of China, Beijing University of Technology, Beijing, 100022, China
  • [ 7 ] [He, Deyan]School of Physical Science and Technology, Lanzhou University, Lanzhou, 730000, China

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Source :

Applied Surface Science

ISSN: 0169-4332

Year: 2008

Issue: 21

Volume: 254

Page: 7109-7113

6 . 7 0 0

JCR@2022

ESI Discipline: MATERIALS SCIENCE;

JCR Journal Grade:1

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 20

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 6

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