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Abstract:
In this paper, we simulate the relationship between the reflectivity and the light incident angle. When the incident angle is more than 23°, the light can not be extracted from LED top emitting surface. We fabricate SiON and SiNx films respectively at low temperature (100 °C) through Plasma Enhanced Chemical Vapor Deposition (PECVD) to serve as the passivation layer of GaN-LEDs, and then compare their light output power. The light output power of the LED improved greatly after depositing the SiON passivation layer.
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Research and Progress of Solid State Electronics
ISSN: 1000-3819
Year: 2007
Issue: 4
Volume: 27
Page: 558-561
Cited Count:
WoS CC Cited Count: 0
SCOPUS Cited Count:
ESI Highly Cited Papers on the List: 0 Unfold All
WanFang Cited Count:
Chinese Cited Count:
30 Days PV: 5
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