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Author:

Shu, Xiong-Wen (Shu, Xiong-Wen.) | Xu, Chen (Xu, Chen.) (Scholars:徐晨) | Tian, Zeng-Xia (Tian, Zeng-Xia.) | Luo, Dan (Luo, Dan.) | Shen, Guang-Di (Shen, Guang-Di.)

Indexed by:

EI Scopus PKU CSCD

Abstract:

The paper investigated the effect of the process parameters, such as chamber pressure, substrate temperature and deposition rate, on the optical characteristics of electron beam evaporation deposited amorphous silicon optical film. It was found that the refractive index and extinction coefficient of the film increased with the increase of the vacuum, substrate and deposition rate in the wavelength range of 300-1100 nm. The results were applied to the deposition of high reflection mirror of semiconductor, and the refractive index of 3.1 and extinction coefficient of 1E-3 at 808 nm, were obtained with the base vacuum of 1E-6 × 133 Pa, the temperature of 100°C and the deposition rate of 0.2 nm.

Keyword:

Deposition Mirrors Refractive index Semiconductor lasers Amorphous silicon Evaporation Optical films Substrates Electron beams

Author Community:

  • [ 1 ] [Shu, Xiong-Wen]Optoelectronic Technology Laboratory, Beijing University of Technology, Beijing 100022, China
  • [ 2 ] [Xu, Chen]Optoelectronic Technology Laboratory, Beijing University of Technology, Beijing 100022, China
  • [ 3 ] [Tian, Zeng-Xia]Optoelectronic Technology Laboratory, Beijing University of Technology, Beijing 100022, China
  • [ 4 ] [Luo, Dan]Optoelectronic Technology Laboratory, Beijing University of Technology, Beijing 100022, China
  • [ 5 ] [Shen, Guang-Di]Optoelectronic Technology Laboratory, Beijing University of Technology, Beijing 100022, China

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Source :

Journal of Optoelectronics Laser

ISSN: 1005-0086

Year: 2006

Issue: 8

Volume: 17

Page: 905-908

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 6

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