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Author:

Xu, Ruihan (Xu, Ruihan.) | Bao, Weijie (Bao, Weijie.) | Yin, Tuo (Yin, Tuo.) | Wang, Zhihai (Wang, Zhihai.) | Wang, Yaohong (Wang, Yaohong.)

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EI Scopus

Abstract:

Electric field assisted Fused Deposition Modeling (E-FDM) is a promising technique in the field of 3D printing. However, large nodes often appear in the start-up stage of printing. When the interval between thin lines is small, large nodes will seriously affect the subsequent printing. In this paper, we will present a method to avoid large nodes in start-up printing according to studies the start-up stage of the printing. The startup stage is a process of liquid gradually deforming and initially contacting the substrate under the action of electric stress. Polycaprolactone (PCL), a popular material for bio-medicine, is selected as the printing material. With a home-build E-FDM system, the nozzle substrate distance is fixed, and the nozzle and substrate temperatures are holding steady. With a photography system, the process of meniscus deformation is recorded. And by image processing methods, the meniscus length and volume of liquid at the nozzle can be obtained. At a set of initial liquid volumes (Vi), nozzle voltage is ramped to a fixed value at a fixed rate. The effects of Vi on the meniscus deformation during the start-up stage of the printing are examined. For sufficiently small Vi, the meniscus deforms into a cone shape (Taylor cone), and a jet with a diameter much smaller than the nozzle diameter appears. For sufficiently large Vi, the meniscus exhibits a spindle shape when it touches the substrate. Through this study, it is suggested that for high resolution printing, ramping the voltage at small Vi is preferable. © 2020 IEEE.

Keyword:

Fused Deposition Modeling Deformation Liquids Nozzles Electric fields Deposition Image processing

Author Community:

  • [ 1 ] [Xu, Ruihan]Beijing University of Technology, Key Laboratory of Optoelectronics Technology, Beijing, China
  • [ 2 ] [Bao, Weijie]Beijing University of Technology, Key Laboratory of Optoelectronics Technology, Beijing, China
  • [ 3 ] [Yin, Tuo]Beijing University of Technology, Key Laboratory of Optoelectronics Technology, Beijing, China
  • [ 4 ] [Wang, Zhihai]Beijing University of Technology, Key Laboratory of Optoelectronics Technology, Beijing, China
  • [ 5 ] [Wang, Yaohong]Tianjin University, Center for Applied Mathematics, Tianjin, China

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Year: 2020

Page: 1811-1816

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 5

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