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Author:

Tang, Jian (Tang, Jian.) | Qiao, Jun-Fei (Qiao, Jun-Fei.) (Scholars:乔俊飞) | Yu, Wen (Yu, Wen.)

Indexed by:

EI Scopus

Abstract:

In industrial process, data-driven soft measuring model based on easy-to-measure process variables can be used to inference and estimate difficulty-to-measure quality or quantity parameter effectively. Normally, there is strong collinearity among these input features. Moreover, only small-size useful input/output data pairs for modeling such difficulty-to-measure predicted parameters can be obtained. In this paper, a new selective ensemble (SEN) modeling approach based on variable importance of projection (VIP) index is proposed to address such data. The VIP values of different input features combined with prior knowledge is used to make feature selection. These selected features are used to construct soft measuring model based on 'Resample training sample' ensemble construction strategy and SEN kernel latent structure algorithm. Simulation results based on mechanical frequency and Near-infrared (NIR) spectral data show effectiveness of the proposed method. © 2018 IEEE.

Keyword:

Infrared devices Feature extraction Genetic algorithms

Author Community:

  • [ 1 ] [Tang, Jian]Faculty of Information Technology, Beijing University of Technology, Beijing, China
  • [ 2 ] [Qiao, Jun-Fei]Faculty of Information Technology, Beijing University of Technology, Beijing, China
  • [ 3 ] [Yu, Wen]Departamento de Control Automatico, CINVESTAV-IPN, Av.IPN 2508, México D.F.; 07360, Mexico

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Year: 2018

Page: 99-104

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 6

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