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Author:

Gao, Shuyuan (Gao, Shuyuan.) | Ji, Rongyi (Ji, Rongyi.) | Li, Yao (Li, Yao.) | Liu, Chun (Liu, Chun.) | Shi, Junkai (Shi, Junkai.) | Pan, Yingling (Pan, Yingling.) | Zhou, Weihu (Zhou, Weihu.)

Indexed by:

Scopus SCIE

Abstract:

In frequency-sweep polarization-modulation ranging, distance is determined by the frequency of modulated waves and the corresponding wavelength multiple when emitted and returned waves are in phase. However, measurement of the frequency and the wavelength multiple is affected by thermally induced phase delay of the polarized wave. In this article we systematically discuss the principle of the ranging method and analyze the influences of thermally induced phase delay. New approaches to measurement are proposed to eliminate the impact on frequency and the wavelength multiple. Theoretical analysis and experimental results proved the efficiency and applicability of the methods.

Keyword:

frequency-sweep polarization-modulation ranging frequency drift error compensation absolute distance measurement

Author Community:

  • [ 1 ] [Gao, Shuyuan]Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Hefei 230009, Anhui, Peoples R China
  • [ 2 ] [Ji, Rongyi]Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R China
  • [ 3 ] [Li, Yao]Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R China
  • [ 4 ] [Shi, Junkai]Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R China
  • [ 5 ] [Pan, Yingling]Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R China
  • [ 6 ] [Zhou, Weihu]Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R China
  • [ 7 ] [Liu, Chun]Beijing Univ Technol, Sch Opt & Photon, Beijing 100081, Peoples R China
  • [ 8 ] [Zhou, Weihu]Univ Chinese Acad Sci, Beijing 100049, Peoples R China

Reprint Author's Address:

  • [Zhou, Weihu]Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R China;;[Zhou, Weihu]Univ Chinese Acad Sci, Beijing 100049, Peoples R China

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Source :

APPLIED SCIENCES-BASEL

Year: 2019

Issue: 6

Volume: 9

2 . 7 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:136

JCR Journal Grade:2

Cited Count:

WoS CC Cited Count: 3

SCOPUS Cited Count: 4

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 6

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