• Complex
  • Title
  • Keyword
  • Abstract
  • Scholars
  • Journal
  • ISSN
  • Conference
搜索

Author:

Ma, Weidong (Ma, Weidong.) | Guo, Min (Guo, Min.) | Meng, Xielei (Meng, Xielei.) | Lv, Changzhi (Lv, Changzhi.) | Xie, Xuesong (Xie, Xuesong.) | Zhang, Xiaoling (Zhang, Xiaoling.) | Liying (Liying.)

Indexed by:

EI Scopus

Abstract:

With the development of manufacturing technology and process level, the reliability of DC/DC converter becomes higher and higher, which is a big challenge to the reliability evaluation of DC/DC converter. In this paper, to solve the problem, DC/DC converter is studied by the test of constant electrical stress and temperature ramp stress method (CETRM). With CETRM, time and cost of the test are efficiently reduced. Ten DC/DC converters are tested using CETRM. Failure sensitive parameter, activation energy, failure temperature, failure rate, lifetime and failure rate are acquired, which testifies the application and efficiency of CETRM for DC/DC converter proposed in this paper. © 2011 IEEE.

Keyword:

Activation energy Reliability Failure analysis DC-DC converters

Author Community:

  • [ 1 ] [Ma, Weidong]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, China
  • [ 2 ] [Guo, Min]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, China
  • [ 3 ] [Meng, Xielei]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, China
  • [ 4 ] [Lv, Changzhi]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, China
  • [ 5 ] [Xie, Xuesong]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, China
  • [ 6 ] [Zhang, Xiaoling]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, China
  • [ 7 ] [Liying]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, China

Reprint Author's Address:

Show more details

Related Keywords:

Related Article:

Source :

Year: 2011

Page: 1056-1059

Language: English

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 8

Online/Total:357/10650588
Address:BJUT Library(100 Pingleyuan,Chaoyang District,Beijing 100124, China Post Code:100124) Contact Us:010-67392185
Copyright:BJUT Library Technical Support:Beijing Aegean Software Co., Ltd.