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Author:

Wang, Piguang (Wang, Piguang.) (Scholars:王丕光) | Zhao, Mi (Zhao, Mi.) (Scholars:赵密) | Du, Xiuli (Du, Xiuli.) (Scholars:杜修力) | Liu, Jingbo (Liu, Jingbo.)

Indexed by:

EI Scopus SCIE

Abstract:

The diffraction of short-crested waves around an elliptical cylinder is solved using the elliptical coordinates, and an analytical solution is obtained in terms of Mathieu and modified Mathieu functions. Analytical expressions for the pressure, the water run-up and the total wave forces on an elliptical cylinder are also derived in this study. The wave run-up of short-crested waves on an elliptical cylinder is quite different from that of a plane incident wave. The maxima and location of the wave run-up as well as the total wave forces are affected significantly by the incident angle and wave phase. Moreover, the total wave forces induced by the short-crested wave on a circular cylinder is overall smaller than that induced by the plane wave with the same wave number, but in some cases the total wave forces induced by the short-crested waves on an elliptical cylinder may be larger than that induced by the plane wave. Thus, it is necessary to take the short-crested wave forces in to account in the design of an offshore structure with elliptical cross-section. (C) 2018 Elsevier Masson SAS. All rights reserved.

Keyword:

Elliptical cylinder Wave phase Wave run-up Short-crested wave Wave force

Author Community:

  • [ 1 ] [Wang, Piguang]Beijing Univ Technol, Beijing 100124, Peoples R China
  • [ 2 ] [Zhao, Mi]Beijing Univ Technol, Beijing 100124, Peoples R China
  • [ 3 ] [Du, Xiuli]Beijing Univ Technol, Beijing 100124, Peoples R China
  • [ 4 ] [Wang, Piguang]Tsinghua Univ, Beijing 100084, Peoples R China
  • [ 5 ] [Liu, Jingbo]Tsinghua Univ, Beijing 100084, Peoples R China

Reprint Author's Address:

  • 赵密

    [Zhao, Mi]Beijing Univ Technol, Beijing 100124, Peoples R China

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Source :

EUROPEAN JOURNAL OF MECHANICS B-FLUIDS

ISSN: 0997-7546

Year: 2019

Volume: 74

Page: 399-409

2 . 6 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:136

JCR Journal Grade:2

Cited Count:

WoS CC Cited Count: 17

SCOPUS Cited Count: 19

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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