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Author:

Xie, S. (Xie, S..) | Yu, J. (Yu, J..) | Liu, T. (Liu, T..) | Chang, Q. (Chang, Q..) | Niu, L. (Niu, L..) | Sun, W. (Sun, W..) (Scholars:孙威)

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Scopus

Abstract:

Thyroid tumor is a common clinical disease. Fully automated computer-aided diagnosis of thyroid nodules has important clinical significance. However, most of the previous works focused on the classification of nodules, benign or malignant, but how to locate the nodules in the ultrasound images is rarely studied. This paper focuses on the problem of thyroid nodule detection, aiming to achieve a fully automated method for delineating the nodule bounding box from the thyroid ultrasound image. We propose a nodule detection algorithm based on the convolutional neural network for this task. We explore the performance of nodule detection in three aspects: multi-scale prediction architecture design, loss function design and postprocessing method. This method is evaluated on clinical data and compared to the ground truth labeled by doctors. The experimental results show that this proposed method can achieve 88.08 % AP with 90.08 % overall recall. © 2019 IEEE.

Keyword:

Convolutional neural network; Detection; Thyroid nodule; Ultrasound image

Author Community:

  • [ 1 ] [Xie, S.]Institute for Artificial Intelligence, State Key Laboratory of Intelligent Technology and Systems, Tsinghua University, Beijing, China
  • [ 2 ] [Yu, J.]Colg. of Computer Science Technology, Beijing Univ. of Technology, Beijing, China
  • [ 3 ] [Liu, T.]Institute for Artificial Intelligence, State Key Laboratory of Intelligent Technology and Systems, Tsinghua University, Beijing, China
  • [ 4 ] [Chang, Q.]National Cancer Center/Cancer Hospital, Chinese Academy of Medical Sciences, Peking Union Medical College, Beijing, China
  • [ 5 ] [Niu, L.]National Cancer Center/Cancer Hospital, Chinese Academy of Medical Sciences, Peking Union Medical College, Beijing, China
  • [ 6 ] [Sun, W.]Institute for Artificial Intelligence, State Key Laboratory of Intelligent Technology and Systems, Tsinghua University, Beijing, China

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Source :

Proceedings of the 14th IEEE Conference on Industrial Electronics and Applications, ICIEA 2019

Year: 2019

Page: 1442-1446

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 17

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 6

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