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Author:

Ding, Qingqing (Ding, Qingqing.) | Li, Suzhi (Li, Suzhi.) | Chen, Long-Qing (Chen, Long-Qing.) | Han, Xiaodong (Han, Xiaodong.) (Scholars:韩晓东) | Zhang, Ze (Zhang, Ze.) | Yu, Qian (Yu, Qian.) | Li, Jixue (Li, Jixue.)

Indexed by:

EI Scopus SCIE

Abstract:

The distribution of Rhenium (Re) in a Ni-based single-crystal superalloy is studied by sub-angstrom resolution transmission electron microscopy (TEM) and energy dispersive X-ray spectroscopy (EDS). It is found that Re atoms segregate at the tensile stress regions near the interfacial dislocation cores, forming the "Cottrell atmosphere", and the segregation process is facilitated by dislocation pipe diffusion. In situ TEM and scanning electron microscopy (SEM) straining studies reveal that the Re-decorated dislocation networks along the phase boundaries act as mechanical walls that effectively block dislocation motion and crack propagation. Furthermore, the degree of Re segregation can be regulated by thermal treatment. Theoretical analysis demonstrates that this remarkable alloying effect originated mainly from the interactions between the local composition strain of Re and the dislocation strains, leading to significantly stabilized interfacial dislocation networks. These results provide a new perspective on understanding the origin of the Re effect on mechanical properties in Ni-based super alloys and will be beneficial to both improving creep properties of Ni-based superalloys and designing high-performance Re-free superalloys. (C) 2018 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

Keyword:

Ni-based single crystal superalloys Rhenium-effect Interface segregation Interfacial dislocation network In situ tension test

Author Community:

  • [ 1 ] [Ding, Qingqing]Zhejiang Univ, Ctr Electron Microscopy, Hangzhou 310027, Zhejiang, Peoples R China
  • [ 2 ] [Zhang, Ze]Zhejiang Univ, Ctr Electron Microscopy, Hangzhou 310027, Zhejiang, Peoples R China
  • [ 3 ] [Yu, Qian]Zhejiang Univ, Ctr Electron Microscopy, Hangzhou 310027, Zhejiang, Peoples R China
  • [ 4 ] [Li, Jixue]Zhejiang Univ, Ctr Electron Microscopy, Hangzhou 310027, Zhejiang, Peoples R China
  • [ 5 ] [Ding, Qingqing]Zhejiang Univ, Dept Mat Sci & Engn, State Key Lab Silicon Mat, Hangzhou 310027, Zhejiang, Peoples R China
  • [ 6 ] [Zhang, Ze]Zhejiang Univ, Dept Mat Sci & Engn, State Key Lab Silicon Mat, Hangzhou 310027, Zhejiang, Peoples R China
  • [ 7 ] [Yu, Qian]Zhejiang Univ, Dept Mat Sci & Engn, State Key Lab Silicon Mat, Hangzhou 310027, Zhejiang, Peoples R China
  • [ 8 ] [Li, Jixue]Zhejiang Univ, Dept Mat Sci & Engn, State Key Lab Silicon Mat, Hangzhou 310027, Zhejiang, Peoples R China
  • [ 9 ] [Li, Suzhi]Xi An Jiao Tong Univ, State Key Lab Mech Behav Mat, Xian 710049, Peoples R China
  • [ 10 ] [Chen, Long-Qing]Penn State Univ, Dept Mat Sci & Engn, University Pk, PA 16802 USA
  • [ 11 ] [Han, Xiaodong]Beijing Univ Technol, Inst Microstruct & Property Adv Mat, Beijing 100024, Peoples R China

Reprint Author's Address:

  • [Yu, Qian]Zhejiang Univ, Ctr Electron Microscopy, Hangzhou 310027, Zhejiang, Peoples R China;;[Li, Jixue]Zhejiang Univ, Ctr Electron Microscopy, Hangzhou 310027, Zhejiang, Peoples R China;;[Yu, Qian]Zhejiang Univ, Dept Mat Sci & Engn, State Key Lab Silicon Mat, Hangzhou 310027, Zhejiang, Peoples R China;;[Li, Jixue]Zhejiang Univ, Dept Mat Sci & Engn, State Key Lab Silicon Mat, Hangzhou 310027, Zhejiang, Peoples R China;;[Chen, Long-Qing]Penn State Univ, Dept Mat Sci & Engn, University Pk, PA 16802 USA

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Source :

ACTA MATERIALIA

ISSN: 1359-6454

Year: 2018

Volume: 154

Page: 137-146

9 . 4 0 0

JCR@2022

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:260

JCR Journal Grade:1

Cited Count:

WoS CC Cited Count: 143

SCOPUS Cited Count: 161

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 11

Online/Total:383/10600020
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