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Author:

Guan, J.-L. (Guan, J.-L..) | Lu, H.-W. (Lu, H.-W..) | Sun, Z.-J. (Sun, Z.-J..) | Wang, W.-C. (Wang, W.-C..) | Chen, Z.-D. (Chen, Z.-D..)

Indexed by:

Scopus

Abstract:

The electrolytic in-process dressing (ELID) grinding process parameter expert system was introduced. With Visual Basic for interface design, this software realized the database management and maintenance by Access, and established an expert system based on the mixed reasoning principle. Users could input physical property parameters of the machined material and the requirement of processing precision, then deduce ELID grinding process parameters and electrolytic parameters of that material. The system has practical value for optimization of ELID grinding process, reduction of processing cost and improvement processing efficiency.

Keyword:

ELID grinding parameters; Expert system; Program design

Author Community:

  • [ 1 ] [Guan, J.-L.]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Lu, H.-W.]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [Sun, Z.-J.]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 4 ] [Wang, W.-C.]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 5 ] [Chen, Z.-D.]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China

Reprint Author's Address:

  • [Guan, J.-L.]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China

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Source :

Diamond and Abrasives Engineering

ISSN: 1006-852X

Year: 2012

Issue: 4

Volume: 32

Page: 86-89,92

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 6

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