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Author:

Zhou, Yu (Zhou, Yu.) | Li, Leida (Li, Leida.) | Gu, Ke (Gu, Ke.) (Scholars:顾锞) | Lu, Zhaolin (Lu, Zhaolin.) | Chen, Beijing (Chen, Beijing.) | Tang, Lu (Tang, Lu.)

Indexed by:

EI Scopus SCIE

Abstract:

Depth-image-based-rendering (DIBR) is a popular technique for view synthesis. The rendering process mainly introduces artifacts around edges, which leads to degraded quality. This letter proposes a DIBR-synthesized image quality metric by measuring the Statistics of both Edge Intensity and Orientation (SEIO). The Canny operator is first used to detect edges. Then the gradient maps are calculated, based on which the intensity and orientation of the edge pixels are computed for both the reference and synthesized images. The distance between the two intensity histograms and that between the two orientation histograms are computed. Finally, the two distances are pooled to obtain the overall quality score. Experimental results demonstrate the advantages of the presented method.

Keyword:

DIBR edge orientation quality evaluation edge intensity

Author Community:

  • [ 1 ] [Zhou, Yu]China Univ Min & Technol, Sch Informat & Control Engn, Xuzhou 221116, Peoples R China
  • [ 2 ] [Li, Leida]China Univ Min & Technol, Sch Informat & Control Engn, Xuzhou 221116, Peoples R China
  • [ 3 ] [Lu, Zhaolin]China Univ Min & Technol, Sch Informat & Control Engn, Xuzhou 221116, Peoples R China
  • [ 4 ] [Tang, Lu]China Univ Min & Technol, Sch Informat & Control Engn, Xuzhou 221116, Peoples R China
  • [ 5 ] [Gu, Ke]Beijing Univ Technol, BJUT Fac Informat Technol, Beijing 100124, Peoples R China
  • [ 6 ] [Chen, Beijing]Nanjing Univ Informat Sci & Technol, Sch Comp & Software, Nanjing 210044, Jiangsu, Peoples R China

Reprint Author's Address:

  • [Li, Leida]China Univ Min & Technol, Sch Informat & Control Engn, Xuzhou 221116, Peoples R China

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Source :

IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS

ISSN: 1745-1361

Year: 2017

Issue: 8

Volume: E100D

Page: 1929-1933

0 . 7 0 0

JCR@2022

ESI Discipline: COMPUTER SCIENCE;

ESI HC Threshold:175

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 6

SCOPUS Cited Count: 7

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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