Online degradation model based on process-stress accelerated test - Details

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Abstract：

An　online　degradation　model　is　presented,　in　which　is　avoided　the　error　in　parameter　degradation　accelerated　test,　which　is　caused　by　temperature　shock　during　parameter　measurement.　Through　the　measurement　with　avoiding　the　error　parameter,　the　parameter　degradation　model　can　be　more　accurate.　To　demonstrate　the　application　of　the　method,　a　kind　of　mature　product,　3CG120,　is　tested　in　a　temperature　range　of　150-230°C　under　online　process-stress.　Then　the　error　of　lifetime　is　obtained　by　utilizing　the　online　model　to　be　about　6.5%,　much　less　than　that　of　the　old　model　(23.2%).　©　Chinese　Physical　Society.

Keyword：

Online measurement; Parameter degradation; Process-stress accelerated test

Author Community：

[ 1 ] [Guo, C.-S.]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
[ 2 ] [Wan, N.]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
[ 3 ] [Ma, W.-D.]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
[ 4 ] [Xiong, C.]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
[ 5 ] [Zhang, G.-C.]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
[ 6 ] [Feng, S.-W.]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China

Reprint Author's Address：

[Guo, C.-S.]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China

Email：

guocs@bjut.edu.cn

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Source ：

Acta Physica Sinica

ISSN： 1000-3290

Year： 2011

Issue： 12

Volume： 60

1 . 0 0 0

JCR@2022

ESI Discipline： PHYSICS;

JCR Journal Grade：2

CAS Journal Grade：4

Cited Count：

WoS CC Cited Count： 0

SCOPUS Cited Count：

ESI Highly Cited Papers on the List： 0 Unfold All

WanFang Cited Count：

Chinese Cited Count：

30 Days PV： 7

Affiliated Colleges：

信息科学技术学院本学院/部未明确归属的数据

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