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Author:

Wang, Xinhua (Wang, Xinhua.) | Xu, Cheng (Xu, Cheng.) | Liu, Qiang (Liu, Qiang.) | Tu, Chengyuan (Tu, Chengyuan.) | Chen, Yingchun (Chen, Yingchun.) | Li, Yingchao (Li, Yingchao.)

Indexed by:

Scopus SCIE

Abstract:

The stray current induced coating delamination at defect areas is complicated and with its mechanism uncovered. In this study, the delamination mechanism of epoxy coating at defect areas under stray alternating current (AC) interference was investigated using electrochemical methods and software simulation. The simulation results indicated that stray AC at defect areas was not evenly distributed. The current density at the defect edge was higher than that at the defect center. The electrochemical results showed different electrochemical behaviors on samples with a various size of defects as AC density increased. The impedance of samples with small defects decreased, on the contrary, the impedance of samples with large defects increased. The delamination area on samples with small defects was larger than that with large defects under the same level of AC interference. Furthermore, the AC interference resulted in a more severe corrosion damage at the small coating defects. Small defects deserve particular attention in the safety assessment at the presence of stray AC.

Keyword:

simulation coating delamination Stray alternating current coating defects

Author Community:

  • [ 1 ] [Wang, Xinhua]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, 100 Ping Le Yuan, Beijing 100124, Peoples R China
  • [ 2 ] [Xu, Cheng]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, 100 Ping Le Yuan, Beijing 100124, Peoples R China
  • [ 3 ] [Liu, Qiang]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, 100 Ping Le Yuan, Beijing 100124, Peoples R China
  • [ 4 ] [Tu, Chengyuan]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, 100 Ping Le Yuan, Beijing 100124, Peoples R China
  • [ 5 ] [Chen, Yingchun]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, 100 Ping Le Yuan, Beijing 100124, Peoples R China
  • [ 6 ] [Li, Yingchao]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, 100 Ping Le Yuan, Beijing 100124, Peoples R China

Reprint Author's Address:

  • [Li, Yingchao]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, 100 Ping Le Yuan, Beijing 100124, Peoples R China

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Source :

INTERNATIONAL JOURNAL OF ELECTROCHEMICAL SCIENCE

ISSN: 1452-3981

Year: 2017

Issue: 7

Volume: 12

Page: 6520-6534

1 . 5 0 0

JCR@2022

ESI Discipline: CHEMISTRY;

ESI HC Threshold:212

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 6

SCOPUS Cited Count: 6

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 5

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