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Author:

Wang, M. (Wang, M..) (Scholars:王民) | Fan, X.-H. (Fan, X.-H..) | Hu, J.-Z. (Hu, J.-Z..) | Zan, T. (Zan, T..)

Indexed by:

Scopus PKU CSCD

Abstract:

To analyze the wear mechanism of the slide-guideway, the deformation model is established under actual machining condition and the reaction pressure of slide-guideway contact surfaces can be calculated by this model. This research designs a scientific and rational accelerated degradation wear test. The wear model of slide-guideway is built by using Archard equation. The wear of guideway contact faces is the main reason for the accuracy degradation of slide-guideway, this paper mainly establishes the guideway contact surfaces wear model. Based on the established analysis model, the wear curve of slide-guideway in the accelerated wear degradation test is predicted under the increasing cutting forces. Results show that this model can better guide the parametric design of actual accelerated wear degradation test and can predict the wear of bed rail under working according to the wear of experiment under high load. ©, 2015, Beijing University of Technology. All right reserved.

Keyword:

Accelerated wear degradation test; Archard equation; Contact deformation; Slide-guideway; Wear

Author Community:

  • [ 1 ] [Wang, M.]Beijing Key Lab of Advanced Manufacturing Technology, Beijing University of Technology, Beijing, 100124, China
  • [ 2 ] [Fan, X.-H.]Beijing Key Lab of Advanced Manufacturing Technology, Beijing University of Technology, Beijing, 100124, China
  • [ 3 ] [Hu, J.-Z.]Beijing Key Lab of Advanced Manufacturing Technology, Beijing University of Technology, Beijing, 100124, China
  • [ 4 ] [Zan, T.]Beijing Key Lab of Advanced Manufacturing Technology, Beijing University of Technology, Beijing, 100124, China

Reprint Author's Address:

  • 王民

    [Wang, M.]Beijing Key Lab of Advanced Manufacturing Technology, Beijing University of TechnologyChina

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Source :

Journal of Beijing University of Technology

ISSN: 0254-0037

Year: 2015

Issue: 4

Volume: 41

Page: 501-506

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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