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Author:

Leng, C. (Leng, C..) | Zhang, H. (Zhang, H..) | Zhang, C. (Zhang, C..) (Scholars:张弛) | Chen, Z. (Chen, Z..) | Yu, N. (Yu, N..)

Indexed by:

Scopus PKU CSCD

Abstract:

Traditional SIFT method has certain false matching points and will miss a large number of correct matching points in image registration process. To solve this problem, an improved SIFT algorithm based on scale, orientation and distance constraint (SODC-SIFT) is proposed in this paper. First, the images are matched with original SIFT algorithm, and the scale and orientation joint restriction are used to remove mismatching pairs. Then, the least square method is employed to calculate the geometric relationship between the two images. Finally, iteration is conducted to select the correct matching points by distance constraint, so as to achieve accurate image registration. Experimental results show that the proposed method has greater robustness and achieves more correct matching pairs than the traditional SIFT method. Furthermore, the correct matching rate is increased and the accuracy of the algorithm is enhanced. © 2017, Editorial Office of Nanotechnology and Precision Engineering. All right reserved.

Keyword:

Feature extraction; Feature matching; Image registration; SIFT

Author Community:

  • [ 1 ] [Leng, C.]School of Mathematics and Information Sciences, Nanchang Hangkong University, Nanchang, 330063, China
  • [ 2 ] [Leng, C.]Key Laboratory of Nondestructive Testing of Ministry of Education, Nanchang Hangkong University, Nanchang, 330063, China
  • [ 3 ] [Zhang, H.]School of Mathematics and Information Sciences, Nanchang Hangkong University, Nanchang, 330063, China
  • [ 4 ] [Zhang, C.]Key Laboratory of Nondestructive Testing of Ministry of Education, Nanchang Hangkong University, Nanchang, 330063, China
  • [ 5 ] [Zhang, C.]School of Measuring and Optical Engineering, Nanchang Hangkong University, Nanchang, 330063, China
  • [ 6 ] [Chen, Z.]Key Laboratory of Nondestructive Testing of Ministry of Education, Nanchang Hangkong University, Nanchang, 330063, China
  • [ 7 ] [Chen, Z.]School of Measuring and Optical Engineering, Nanchang Hangkong University, Nanchang, 330063, China
  • [ 8 ] [Yu, N.]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, 100124, China

Reprint Author's Address:

  • [Leng, C.]School of Mathematics and Information Sciences, Nanchang Hangkong UniversityChina

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Source :

Nanotechnology and Precision Engineering

ISSN: 1672-6030

Year: 2017

Issue: 1

Volume: 15

Page: 36-43

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 2

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 8

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