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Author:

Kong, Deli (Kong, Deli.) | Sun, Shiduo (Sun, Shiduo.) | Xin, Tianjiao (Xin, Tianjiao.) | Xiao, Lirong (Xiao, Lirong.) | Sha, Xuechao (Sha, Xuechao.) | Lu, Yan (Lu, Yan.) | Mao, Shengcheng (Mao, Shengcheng.) (Scholars:毛圣成) | Zou, Jin (Zou, Jin.) | Wang, Lihua (Wang, Lihua.) (Scholars:王立华) | Han, Xiaodong (Han, Xiaodong.) (Scholars:韩晓东)

Indexed by:

Scopus SCIE

Abstract:

Revealing the atomic-scale deformation mechanisms of metallic nanowires (NWs) is important for their practical application. However, there are few reports providing direct atomic-scale experimental elucidation on those metallic NWs. Here, we conduct serial in situ deformation tests on silver (Ag) nanowires with diameters of 3-11 nm. The in situ atomic-scale observations reveal a transition in the deformation mechanism with a decrease in the diameter of Ag NWs. For the [5 (5) over bar4] and [001] oriented NWs with diameters of similar to 11 nm, the plastic deformation is dominated by full dislocation that involves leading and trailing partial dislocations, whereas the full or extended dislocations are rarely observed in the NWs with diameters in the range of similar to 5-8 nm, and their plastic deformation is governed by SF generation and annihilation. Moreover, for the [(1) over bar 11] oriented NWs, 60 degrees mixed and pure edge dislocations are frequently observed when the diameter is approximately 5 nm and the plastic deformation is accommodated by relative slip between two adjacent {111} planes for NWs with diameters below similar to 3 nm. These results indicate that the plastic deformation not only depends on the size of NWs but also can be significantly impacted by the loading orientation. (C) 2016 Elsevier B.V. All rights reserved.

Keyword:

Plasticity Atomic-scale Silver nanowire In situ Size effect

Author Community:

  • [ 1 ] [Kong, Deli]Beijing Univ Technol, Inst Microstruct & Properties Adv Mat, Beijing Key Lab Microstruct & Property Adv Mat, Beijing, Peoples R China
  • [ 2 ] [Sun, Shiduo]Beijing Univ Technol, Inst Microstruct & Properties Adv Mat, Beijing Key Lab Microstruct & Property Adv Mat, Beijing, Peoples R China
  • [ 3 ] [Xin, Tianjiao]Beijing Univ Technol, Inst Microstruct & Properties Adv Mat, Beijing Key Lab Microstruct & Property Adv Mat, Beijing, Peoples R China
  • [ 4 ] [Xiao, Lirong]Beijing Univ Technol, Inst Microstruct & Properties Adv Mat, Beijing Key Lab Microstruct & Property Adv Mat, Beijing, Peoples R China
  • [ 5 ] [Sha, Xuechao]Beijing Univ Technol, Inst Microstruct & Properties Adv Mat, Beijing Key Lab Microstruct & Property Adv Mat, Beijing, Peoples R China
  • [ 6 ] [Lu, Yan]Beijing Univ Technol, Inst Microstruct & Properties Adv Mat, Beijing Key Lab Microstruct & Property Adv Mat, Beijing, Peoples R China
  • [ 7 ] [Mao, Shengcheng]Beijing Univ Technol, Inst Microstruct & Properties Adv Mat, Beijing Key Lab Microstruct & Property Adv Mat, Beijing, Peoples R China
  • [ 8 ] [Wang, Lihua]Beijing Univ Technol, Inst Microstruct & Properties Adv Mat, Beijing Key Lab Microstruct & Property Adv Mat, Beijing, Peoples R China
  • [ 9 ] [Han, Xiaodong]Beijing Univ Technol, Inst Microstruct & Properties Adv Mat, Beijing Key Lab Microstruct & Property Adv Mat, Beijing, Peoples R China
  • [ 10 ] [Zou, Jin]Univ Queensland, Mat Engn, Brisbane, Qld 4072, Australia
  • [ 11 ] [Wang, Lihua]Univ Queensland, Mat Engn, Brisbane, Qld 4072, Australia
  • [ 12 ] [Zou, Jin]Univ Queensland, Ctr Microscopy & Microanal, Brisbane, Qld 4072, Australia

Reprint Author's Address:

  • 王立华 韩晓东

    [Wang, Lihua]Beijing Univ Technol, Inst Microstruct & Properties Adv Mat, Beijing Key Lab Microstruct & Property Adv Mat, Beijing, Peoples R China;;[Han, Xiaodong]Beijing Univ Technol, Inst Microstruct & Properties Adv Mat, Beijing Key Lab Microstruct & Property Adv Mat, Beijing, Peoples R China;;[Wang, Lihua]Univ Queensland, Mat Engn, Brisbane, Qld 4072, Australia

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Source :

JOURNAL OF ALLOYS AND COMPOUNDS

ISSN: 0925-8388

Year: 2016

Volume: 676

Page: 377-382

6 . 2 0 0

JCR@2022

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:305

CAS Journal Grade:1

Cited Count:

WoS CC Cited Count: 14

SCOPUS Cited Count: 16

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 6

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