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Author:

Lv, Xiaozhan (Lv, Xiaozhan.) | Ji, Lingfei (Ji, Lingfei.) (Scholars:季凌飞) | Wu, Yan (Wu, Yan.) | Lin, Zhenyuan (Lin, Zhenyuan.) | Yan, Yinzhou (Yan, Yinzhou.) (Scholars:闫胤洲)

Indexed by:

Scopus SCIE

Abstract:

The fabrication of porous silicon with double band photoluminescence (PL) by chemical-assisted 1064 nm picosecond (ps) laser irradiation of polysilicon is presented. The hybrid method includes controlling of the laser scanning interval, number of scans to form dense micropores, and subsequently, short- time acid corrosion to form fine nanostructure. Along with the stable red PL visible to the naked eye, a new violet PL band at 432 nm existed in the fabricated samples. The double band photoluminescence was mainly attributed to the prepared micro/ nano hierarchical structure. Moreover, dangling bond defects formed by high- energy photon impinging acted as the catalyzer in the subsequent acid corrosion resulted in good passivation of the nanostructure with the formation of Si-H and Si-O bond, which also contributed to the stable photoluminescence. The maximum surface porosity of the samples was concluded to be 90.48% which also bring good hydrophobicity for the prepared samples. (C) 2016 Laser Institute of America.

Keyword:

chemical corrosion porous Si picosecond laser photoluminescence

Author Community:

  • [ 1 ] [Lv, Xiaozhan]Beijing Univ Technol, Inst Laser Engn, Beijing 100124, Peoples R China
  • [ 2 ] [Ji, Lingfei]Beijing Univ Technol, Inst Laser Engn, Beijing 100124, Peoples R China
  • [ 3 ] [Wu, Yan]Beijing Univ Technol, Inst Laser Engn, Beijing 100124, Peoples R China
  • [ 4 ] [Lin, Zhenyuan]Beijing Univ Technol, Inst Laser Engn, Beijing 100124, Peoples R China
  • [ 5 ] [Yan, Yinzhou]Beijing Univ Technol, Inst Laser Engn, Beijing 100124, Peoples R China

Reprint Author's Address:

  • 季凌飞

    [Ji, Lingfei]Beijing Univ Technol, Inst Laser Engn, Beijing 100124, Peoples R China

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Source :

JOURNAL OF LASER APPLICATIONS

ISSN: 1042-346X

Year: 2016

Issue: 2

Volume: 28

2 . 1 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:166

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 6

SCOPUS Cited Count: 7

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 4

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