• Complex
  • Title
  • Keyword
  • Abstract
  • Scholars
  • Journal
  • ISSN
  • Conference
搜索

Author:

Zheng, Kun (Zheng, Kun.) (Scholars:郑坤) | Zhang, Zhi (Zhang, Zhi.) | Hu, Yibin (Hu, Yibin.) | Chen, Pingping (Chen, Pingping.) | Lu, Wei (Lu, Wei.) | Drennan, John (Drennan, John.) | Han, Xiaodong (Han, Xiaodong.) (Scholars:韩晓东) | Zou, Jin (Zou, Jin.)

Indexed by:

Scopus SCIE PubMed

Abstract:

Understanding the electrical properties of defect-free nanowires with so different structures and their responses under deformation are essential for design and applications of nanodevices and strain engineering. In this study, defect-free zinc-blende- and wurtzite-structured InAs nanowires were grown using molecular beam epitaxy, and individual nanowires with different structures and orientations were carefully selected and their electrical properties and electromechanical responses were investigated using an electrical probing system inside a transmission. electron microscope. Through our careful experimental design and detailed analyses, we uncovered several extraordinary physical phenomena, such as the electromechanical characteristics are dominated by the nanowire orientation, rather than its crystal structure. Our results provide critical insights into different responses induced by deformation of InAs with different structures, which is important for nanowire-based devices.

Keyword:

deformation electron transmission microscope InAs nanowires electrical properties

Author Community:

  • [ 1 ] [Zheng, Kun]Beijing Univ Technol, Inst Microstruct & Properties Adv Mat, Beijing Key Lab Microstruct & Property Adv Mat, Beijing 100124, Peoples R China
  • [ 2 ] [Han, Xiaodong]Beijing Univ Technol, Inst Microstruct & Properties Adv Mat, Beijing Key Lab Microstruct & Property Adv Mat, Beijing 100124, Peoples R China
  • [ 3 ] [Zheng, Kun]Univ Queensland, Ctr Microscopy & Microanal, St Lucia, Qld 4072, Australia
  • [ 4 ] [Drennan, John]Univ Queensland, Ctr Microscopy & Microanal, St Lucia, Qld 4072, Australia
  • [ 5 ] [Zou, Jin]Univ Queensland, Ctr Microscopy & Microanal, St Lucia, Qld 4072, Australia
  • [ 6 ] [Zheng, Kun]Univ Queensland, Australian Inst Bioengn & Nanotechnol, St Lucia, Qld 4072, Australia
  • [ 7 ] [Drennan, John]Univ Queensland, Australian Inst Bioengn & Nanotechnol, St Lucia, Qld 4072, Australia
  • [ 8 ] [Zhang, Zhi]Univ Queensland, Mat Engn, St Lucia, Qld 4072, Australia
  • [ 9 ] [Zou, Jin]Univ Queensland, Mat Engn, St Lucia, Qld 4072, Australia
  • [ 10 ] [Hu, Yibin]Chinese Acad Sci, Shanghai Inst Tech Phys, Natl Lab Infrared Phys, 500 Yu Tian Rd, Shanghai 200083, Peoples R China
  • [ 11 ] [Chen, Pingping]Chinese Acad Sci, Shanghai Inst Tech Phys, Natl Lab Infrared Phys, 500 Yu Tian Rd, Shanghai 200083, Peoples R China
  • [ 12 ] [Lu, Wei]Chinese Acad Sci, Shanghai Inst Tech Phys, Natl Lab Infrared Phys, 500 Yu Tian Rd, Shanghai 200083, Peoples R China

Reprint Author's Address:

  • 郑坤

    [Zheng, Kun]Beijing Univ Technol, Inst Microstruct & Properties Adv Mat, Beijing Key Lab Microstruct & Property Adv Mat, Beijing 100124, Peoples R China;;[Zheng, Kun]Univ Queensland, Ctr Microscopy & Microanal, St Lucia, Qld 4072, Australia;;[Zou, Jin]Univ Queensland, Ctr Microscopy & Microanal, St Lucia, Qld 4072, Australia;;[Zheng, Kun]Univ Queensland, Australian Inst Bioengn & Nanotechnol, St Lucia, Qld 4072, Australia;;[Zou, Jin]Univ Queensland, Mat Engn, St Lucia, Qld 4072, Australia

Show more details

Related Keywords:

Source :

NANO LETTERS

ISSN: 1530-6984

Year: 2016

Issue: 3

Volume: 16

Page: 1787-1793

1 0 . 8 0 0

JCR@2022

ESI Discipline: PHYSICS;

ESI HC Threshold:175

CAS Journal Grade:1

Cited Count:

WoS CC Cited Count: 30

SCOPUS Cited Count: 30

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 8

Online/Total:704/10590083
Address:BJUT Library(100 Pingleyuan,Chaoyang District,Beijing 100124, China Post Code:100124) Contact Us:010-67392185
Copyright:BJUT Library Technical Support:Beijing Aegean Software Co., Ltd.