Near-3:2　mullite　crystals　have　been　grown　successfully　with　the　optical　floating　zone　technique.　The　growth　direction　of　mullite　crystals　is　along　the　c　axis　and　growth　rate　can　be　reached　10　mm/h.　The　effect　of　growth　rates　on　the　crystal　quality　has　been　studied.　The　crystalline　phase,　crystal　quality,　microstructure,　composition　distribution　of　the　grown　crystals　were　characterized　by　powder　X-ray　diffraction,　single　crystal　X-ray　diffraction,　scanning　electron　microscope,　electron　probe　micro-analyzer　and　Raman　spectra,　respectively.　The　grown　mullite　crystal　is　formed　by　peritectic　structure　with　near　3:2　mullite　crystal　as　main　face　and　lamellar　or　needle-like　SiO2-rich　aluminosilicate　as　secondary　phase　that　parallel　to　the　crystal　growth　direction.　The　measured　dielectric　properties　show　large　dielectric　anisotropy　and　good　temperature　stability　in　near-3:2　mullite　crystals.　(C)　2015　Elsevier　Ltd.　All　rights　reserved.