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Author:

He, Baofeng (He, Baofeng.) | Petzing, Jon (Petzing, Jon.) | Webb, Patrick (Webb, Patrick.) | Leach, Richard (Leach, Richard.)

Indexed by:

EI Scopus SCIE

Abstract:

Glass is a promising substitute substrate material being evaluated for electronic packaging technology. Improving the electroless copper plated layer adhesion of the glass is one of the most important considerations for development of the technology. An excimer laser (248 nm) was used for structured texturing of glass surfaces (to improve adhesion) by changing mask dimensions, laser operating parameters and overlapping pitch spacing, and therefore producing a range of micro-scale features. Electroless plated copper adhesion strength was assessed using quantitative scratch testing, demonstrating that micro-patterned structures can significantly improve copper/glass adhesion. New ISO 25178 Part 2 areal surface texture parameters were used to characterise the surface roughness of ablated glass surfaces, and correlated to the scratch testing results. Highly correlated parameters were identified that could be used as predictive surface design tools, directly linking surface topography to adhesion performance, without the need for destructive adhesion quantification via scratch testing. (C) 2015 Elsevier Ltd. All rights reserved.

Keyword:

Micro-patterning Adhesion Glass Areal parameters Excimer laser

Author Community:

  • [ 1 ] [He, Baofeng]Beijing Univ Technol, Beijing Engn Res Ctr Precis Measurement Technol &, Beijing 100124, Peoples R China
  • [ 2 ] [Petzing, Jon]Univ Loughborough, Wolfson Sch Mech & Mfg Engn, Loughborough LE11 3TU, Leics, England
  • [ 3 ] [Webb, Patrick]Univ Loughborough, Wolfson Sch Mech & Mfg Engn, Loughborough LE11 3TU, Leics, England
  • [ 4 ] [Leach, Richard]Univ Nottingham, Fac Engn, Nottingham NG7 2RD, England

Reprint Author's Address:

  • [He, Baofeng]Beijing Univ Technol, Beijing Engn Res Ctr Precis Measurement Technol &, 100 Ping Le Yuan, Beijing 100124, Peoples R China

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Source :

OPTICS AND LASERS IN ENGINEERING

ISSN: 0143-8166

Year: 2015

Volume: 75

Page: 39-47

4 . 6 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:174

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 16

SCOPUS Cited Count: 19

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 7

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