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Author:

Shi, Dong (Shi, Dong.) | Feng, Shiwei (Feng, Shiwei.) (Scholars:冯士维) | Zhang, Yamin (Zhang, Yamin.) | Qiao, Yanbin (Qiao, Yanbin.) | Deng, Bing (Deng, Bing.)

Indexed by:

EI Scopus SCIE

Abstract:

In this paper, the superposition method is used to investigate the complete temperature field of a light-emitting diode (LED) packaging substrate, based on the results of transient temperature rise measurements and the thermal resistance coupling matrix. The feasibility of use of the superposition method in an LED array with multiple packages has been proved first by temperature comparisons with the simultaneous operation of an array (5 x 5) of 25 high power LEDs mounted on a metal core printed circuit board (MCPCB). Compared with existing approaches, the superposition method will measure the internal temperature of chip directly, accurately and nondestructively. According to the relatively accurate and reliable self-heating and coupling temperature rise data, optimization scheme of LED lamp with multiple packages is proposed. The results show that increasing the heat source separation distance and improving the thermal conductivity of thermal interface materials will reduce the temperature rise and thermal non-uniformity. (C) 2015 Elsevier Ltd. All rights reserved.

Keyword:

Temperature distribution Superposition LED array Spreading thermal resistance

Author Community:

  • [ 1 ] [Shi, Dong]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100124, Peoples R China
  • [ 2 ] [Feng, Shiwei]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100124, Peoples R China
  • [ 3 ] [Zhang, Yamin]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100124, Peoples R China
  • [ 4 ] [Deng, Bing]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100124, Peoples R China
  • [ 5 ] [Qiao, Yanbin]Beijing Nan Smart Chip Microelect Technol Co Ltd, Beijing 100192, Peoples R China

Reprint Author's Address:

  • 冯士维

    [Feng, Shiwei]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100124, Peoples R China

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Source :

MICROELECTRONICS JOURNAL

ISSN: 0026-2692

Year: 2015

Issue: 7

Volume: 46

Page: 632-636

2 . 2 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:174

JCR Journal Grade:3

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 17

SCOPUS Cited Count: 21

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 8

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