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Author:

Li, Nan (Li, Nan.) | Yang, Xiangdong (Yang, Xiangdong.) | Gong, Yu (Gong, Yu.) | Wang, Pai (Wang, Pai.)

Indexed by:

EI Scopus SCIE

Abstract:

Electrical capacitance tomography is a non-invasive imaging technique that uses measured capacitances to recover the unknown permittivity distribution in the medium. A new method using fuzzy theory and quantifiers in enhancing the ECT sensor system design and the associated data fusion is presented. Unlike the traditional methods that set a single indicator as the optimization objective, the method presented in the paper provides a way to integrate multiple evaluation criteria (some may conflict with others) of ECT sensors into a single comparable index. The uniformity index, the correlation coefficient and combinatorial fuzzy index of ECTs are set as the optimization objectives respectively at the experimental stage to evaluate the validity of the method. The experiments are set up based on multi-index orthogonal design and the experimental results indicate that the fuzzy optimization method can derive an optimized sensor structure with an evenly distributed sensitivity field and a better imaging reconstruction result at the same time. It proves the method is intuitive, reliable, and practical.

Keyword:

electrical capacitance tomography orthogonal design fuzzy theory sensitivity map optimization design

Author Community:

  • [ 1 ] [Li, Nan]Beijing Univ Technol, Dept Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 2 ] [Yang, Xiangdong]Beijing Univ Technol, Dept Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 3 ] [Gong, Yu]Beijing Univ Technol, Dept Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 4 ] [Wang, Pai]Xian Univ Sci & Technol, Sch Elect & Control Engineer, Xian 710054, Peoples R China

Reprint Author's Address:

  • [Li, Nan]Beijing Univ Technol, Dept Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China

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Source :

MEASUREMENT SCIENCE AND TECHNOLOGY

ISSN: 0957-0233

Year: 2014

Issue: 12

Volume: 25

2 . 4 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:176

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 11

SCOPUS Cited Count: 12

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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