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Author:

Nie, Meng (Nie, Meng.) | Zhao, Yan (Zhao, Yan.) (Scholars:赵艳) | Zeng, Yong (Zeng, Yong.)

Indexed by:

EI Scopus SCIE

Abstract:

Zinc oxide (ZnO) thin films were deposited on a sapphire (001) by pulsed laser deposition technique at room temperature. The profound changes of ZnO thin films had been observed. The large surface morphology difference of ZnO thin films between annealing and laser irradiation was found. Meanwhile, the dependence of photoluminescence (PL) spectra on annealing temperature and laser irradiation energy had been investigated. As the annealing temperature and laser irradiation energy increased, the PL intensity of visible luminescence decreased. In contrast, the intensity of ultraviolet (UV) emission increased largely with the increasing laser energy. However, annealing treatment had no effect on the UV emission behavior. The results from Hall measurements and the variation of visible emission indicated annealing and laser irradiation had the same influence on controlling the concentration and some native defects in ZnO thin films. Besides, the thermal and photochemical effects of KrF excimer led to an enormous accumulation of zinc interstitial, and the carrier concentration increased up to six orders of magnitude. Furthermore, the origins of UV and visible emissions were discussed. (C) 2014 Laser Institute of America.

Keyword:

annealing laser irradiation ZnO thin films optical and electrical properties

Author Community:

  • [ 1 ] [Nie, Meng]Beijing Univ Technol, Inst Laser Engn, Beijing 100124, Peoples R China
  • [ 2 ] [Zhao, Yan]Beijing Univ Technol, Inst Laser Engn, Beijing 100124, Peoples R China
  • [ 3 ] [Zeng, Yong]Beijing Univ Technol, Inst Laser Engn, Beijing 100124, Peoples R China

Reprint Author's Address:

  • [Nie, Meng]Beijing Univ Technol, Inst Laser Engn, Beijing 100124, Peoples R China

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Source :

JOURNAL OF LASER APPLICATIONS

ISSN: 1042-346X

Year: 2014

Issue: 2

Volume: 26

2 . 1 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:176

JCR Journal Grade:2

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 12

SCOPUS Cited Count: 14

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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