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Author:

Bai, Shi (Bai, Shi.) | Zhou, Weiping (Zhou, Weiping.) | Tao, Chen (Tao, Chen.) | Oakes, Ken D. (Oakes, Ken D..) | Hu, Anming (Hu, Anming.)

Indexed by:

EI Scopus SCIE

Abstract:

Surface-enhanced Raman spectroscopy (SERS) is rapidly emerging as a powerful analytical tool for trace analysis of metallic substrates. While innovative numerical applications of SERS have been developed, it is still a challenge to fabricate cost-effective and reproducible metallic substrates for SERS probes. Laser processing, especially using ultrafast pulsed laser, can address this issue owing to their high quality processing. Herein, we investigate critical technical requirements and the latest advancements in laser-processing substrates for SERS, while highlighting several diverse applications. In light of its powerful enhancement of Raman scattering, SERS will remain an exciting research area for highly sensitive, resolved analysis into the foreseeable future.

Keyword:

Raman scattering Enhancement factor metal nanostructure surface enhancement laser interference laser processing

Author Community:

  • [ 1 ] [Bai, Shi]Beijing Univ Technol, Inst Laser Engn, Beijing 100022, Peoples R China
  • [ 2 ] [Zhou, Weiping]Beijing Univ Technol, Inst Laser Engn, Beijing 100022, Peoples R China
  • [ 3 ] [Tao, Chen]Beijing Univ Technol, Inst Laser Engn, Beijing 100022, Peoples R China
  • [ 4 ] [Hu, Anming]Beijing Univ Technol, Inst Laser Engn, Beijing 100022, Peoples R China
  • [ 5 ] [Oakes, Ken D.]Cape Breton Univ, Dept Biol, Verschuren Ctr, Sydney, NSW B1P 6L2, Australia

Reprint Author's Address:

  • [Hu, Anming]Beijing Univ Technol, Inst Laser Engn, 100 Pingle Yuan, Beijing 100022, Peoples R China

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Source :

CURRENT NANOSCIENCE

ISSN: 1573-4137

Year: 2014

Issue: 4

Volume: 10

Page: 486-496

1 . 5 0 0

JCR@2022

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:341

JCR Journal Grade:3

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 15

SCOPUS Cited Count: 18

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 7

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