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Author:

Lu, Liping (Lu, Liping.) (Scholars:鲁理平) | Xu, Laihui (Xu, Laihui.) | Kang, Tianfang (Kang, Tianfang.) (Scholars:康天放) | Cheng, Shuiyuan (Cheng, Shuiyuan.) (Scholars:程水源)

Indexed by:

EI Scopus SCIE

Abstract:

DNA damage induced from perfluorooctane sulfonate (PFOS) was further developed on a nano-porous bionic interface. The interface was formed by assembling DNA on nano-gold particles which were embedded in a nano-porous overoxidized polypyrrole film (OPPy). Atomic force microscopy, scanning electron microscope and electrochemical investigations indicate that OPPy can be treated to form nano-pore structures. DNA damage due to PFOS was proved using electrochemistry and X-ray photoelectron spectroscopy (XPS) and was investigated by detecting differential pulse voltammetry (DPV) response of methylene blue (MB) which was used as electro-active indicator in the system. The current of MB attenuates obviously after incubation of DNA in PFOS. Moreover, electrochemical impedance spectroscopy (EIS) demonstrates that PFOS weakens DNA charge transport. The tentative binding ratio of PFOS: DNA base pair was obtained by analyzing XPS data of this system. (C) 2013 Elsevier B. V. All rights reserved.

Keyword:

Polypyrrole DNA damage Electrochemical PFOS

Author Community:

  • [ 1 ] [Lu, Liping]Beijing Univ Technol, Coll Environm & Energy Engn, Beijing 100124, Peoples R China
  • [ 2 ] [Xu, Laihui]Beijing Univ Technol, Coll Environm & Energy Engn, Beijing 100124, Peoples R China
  • [ 3 ] [Kang, Tianfang]Beijing Univ Technol, Coll Environm & Energy Engn, Beijing 100124, Peoples R China
  • [ 4 ] [Cheng, Shuiyuan]Beijing Univ Technol, Coll Environm & Energy Engn, Beijing 100124, Peoples R China

Reprint Author's Address:

  • 鲁理平

    [Lu, Liping]Beijing Univ Technol, Coll Environm & Energy Engn, Beijing 100124, Peoples R China

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Source :

APPLIED SURFACE SCIENCE

ISSN: 0169-4332

Year: 2013

Volume: 284

Page: 258-262

6 . 7 0 0

JCR@2022

ESI Discipline: MATERIALS SCIENCE;

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count: 5

SCOPUS Cited Count: 5

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 8

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