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Author:

Wei Xiao-Lin (Wei Xiao-Lin.) | Chen Yuan-Ping (Chen Yuan-Ping.) | Wang Ru-Zhi (Wang Ru-Zhi.) (Scholars:王如志) | Zhong Jian-Xin (Zhong Jian-Xin.)

Indexed by:

EI Scopus SCIE PKU CSCD

Abstract:

In practical applications of graphene-based electronic devices, they may have some pore defects under energetic particle bombardment, or chemical corrosion, which will inevitably affect their electrical properties. These problems have recently aroused great concern and interest. In this paper, we systematically study the influence of shape (tripartite, tetragonal and hexagonal) of hole defect on the electrical property of zigzag graphene nanoribbon (ZGNR). The results show that the influence of the shape of the pore defects on the conductance and current characteristics of ZGNRs is significant, whicl may result from electron scattering for the different shapes of the poredefect boundary. In addition, due to defects in suspension adsorbed hydrogen or nitrogen atoms, caused by defects of the pore shape changes, it also affects the electrical properties of ZGNRs. This study will supply valuable theoretical guidances for graphene-based electronic device failure analysis and the design of the graphene pore structure.

Keyword:

pore defects electrical properties graphene

Author Community:

  • [ 1 ] [Wei Xiao-Lin]Xiangtan Univ, Dept Phys, Lab Quantum Engn & Micronano Energy Technol, Xiangtan 411105, Hunan, Peoples R China
  • [ 2 ] [Chen Yuan-Ping]Xiangtan Univ, Dept Phys, Lab Quantum Engn & Micronano Energy Technol, Xiangtan 411105, Hunan, Peoples R China
  • [ 3 ] [Zhong Jian-Xin]Xiangtan Univ, Dept Phys, Lab Quantum Engn & Micronano Energy Technol, Xiangtan 411105, Hunan, Peoples R China
  • [ 4 ] [Wang Ru-Zhi]Beijing Univ Technol, Coll Mat Sci & Engn, Lab Thin Film Mat, Beijing 100124, Peoples R China

Reprint Author's Address:

  • [Wei Xiao-Lin]Xiangtan Univ, Dept Phys, Lab Quantum Engn & Micronano Energy Technol, Xiangtan 411105, Hunan, Peoples R China

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Source :

ACTA PHYSICA SINICA

ISSN: 1000-3290

Year: 2013

Issue: 5

Volume: 62

1 . 0 0 0

JCR@2022

ESI Discipline: PHYSICS;

JCR Journal Grade:3

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 2

SCOPUS Cited Count: 4

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 5

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