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Author:

Yuan, Xueyong (Yuan, Xueyong.) | Xue, Xiaobo (Xue, Xiaobo.) | Zhang, Xiaona (Zhang, Xiaona.) | Wen, Zheng (Wen, Zheng.) | Yang, Mao (Yang, Mao.) | Du, Jun (Du, Jun.) | Wu, Di (Wu, Di.) | Xu, Qingyu (Xu, Qingyu.)

Indexed by:

EI Scopus SCIE

Abstract:

Single phase polycrystalline BiFeO3 thin films have been grown on Si substrates using LaNiO3 as buffer layers by pulsed laser deposition. A transmission electron microscope shows an amorphous thin layer of LaNiO3 followed by the polycrystalline LaNiO3, which facilitates the crystallization of a BiFeO3 layer in R3c structure and suppression of the impurity phases. NiFe layers were deposited on the BiFeO3 layer by magnetron sputtering. Clear exchange coupling between BiFeO3 and NiFe (with maximum exchange bias field up to 61 Oe) has been observed at room temperature, and the exchange bias field decreases with increasing the NiFe thickness. Our results clearly demonstrate the potential application of polycrystalline BiFeO3 in magnetoelectric coupling based spintronics. (C) 2011 Elsevier Ltd. All rights reserved.

Keyword:

Exchange and superexchange Laser processing Magnetic films and multilayers

Author Community:

  • [ 1 ] [Yuan, Xueyong]Southeast Univ, Dept Phys, Nanjing 211189, Jiangsu, Peoples R China
  • [ 2 ] [Xu, Qingyu]Southeast Univ, Dept Phys, Nanjing 211189, Jiangsu, Peoples R China
  • [ 3 ] [Xue, Xiaobo]Nanjing Univ, Dept Phys, Nanjing 210008, Peoples R China
  • [ 4 ] [Yang, Mao]Nanjing Univ, Dept Phys, Nanjing 210008, Peoples R China
  • [ 5 ] [Du, Jun]Nanjing Univ, Dept Phys, Nanjing 210008, Peoples R China
  • [ 6 ] [Zhang, Xiaona]Beijing Univ Technol, Inst Microstruct & Property Adv Mat, Beijing 100124, Peoples R China
  • [ 7 ] [Wen, Zheng]Nanjing Univ, Dept Mat Sci & Engn, Nanjing 210008, Peoples R China
  • [ 8 ] [Wu, Di]Nanjing Univ, Dept Mat Sci & Engn, Nanjing 210008, Peoples R China

Reprint Author's Address:

  • [Xu, Qingyu]Southeast Univ, Dept Phys, Nanjing 211189, Jiangsu, Peoples R China

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Source :

SOLID STATE COMMUNICATIONS

ISSN: 0038-1098

Year: 2012

Issue: 4

Volume: 152

Page: 241-243

2 . 1 0 0

JCR@2022

ESI Discipline: PHYSICS;

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 15

SCOPUS Cited Count: 15

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 8

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