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Author:

Zhu, Cui (Zhu, Cui.) | Kitagawa, Hiroyuki (Kitagawa, Hiroyuki.) | Papadimitriou, Spiros (Papadimitriou, Spiros.) | Faloutsos, Christos (Faloutsos, Christos.)

Indexed by:

SCIE

Abstract:

Outlier detection is a useful technique in such areas as fraud detection, financial analysis and health monitoring. Many recent approaches detect outliers according to reasonable, pre-defined concepts of an outlier (e.g., distance-based, density-based, etc.). However, the definition of an outlier differs between users or even datasets. This paper presents a solution to this problem by including input from the users. Our OBE (Outlier By Example) system is the first that allows users to provide examples of outliers in low-dimensional datasets. By incorporating a small number of such examples, OBE can successfully develop an algorithm by which to identify further outliers based on their outlierness. Several algorithmic challenges and engineering decisions must be addressed in building such a system. We describe the key design decisions and algorithms in this paper. In order to interact with users having different degrees of domain knowledge, we develop two detection schemes: OBE-Fraction and OBE-RF. Our experiments on both real and synthetic datasets demonstrate that OBE can discover values that a user would consider outliers.

Keyword:

Machine learning Outlier detection Outlier example Data mining

Author Community:

  • [ 1 ] [Zhu, Cui]Beijing Univ Technol, Coll Comp Sci, Beijing 100124, Peoples R China
  • [ 2 ] [Kitagawa, Hiroyuki]Univ Tsukuba, Grad Sch Syst & Informat Engn, Ctr Computat Sci, Tsukuba, Ibaraki 3058577, Japan
  • [ 3 ] [Papadimitriou, Spiros]IBM T J Watson, Hawthorne, NY USA
  • [ 4 ] [Faloutsos, Christos]Carnegie Mellon Univ, Pittsburgh, PA 15213 USA

Reprint Author's Address:

  • [Zhu, Cui]Beijing Univ Technol, Coll Comp Sci, Beijing 100124, Peoples R China

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Source :

JOURNAL OF INTELLIGENT INFORMATION SYSTEMS

ISSN: 0925-9902

Year: 2011

Issue: 2

Volume: 36

Page: 217-247

3 . 4 0 0

JCR@2022

ESI Discipline: COMPUTER SCIENCE;

JCR Journal Grade:3

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 9

SCOPUS Cited Count: 9

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 5

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