Structural characterization of highly defective Al-Pd-Fe crystalline approximant - Details

Author：

Sun, W. (Sun, W..) (Scholars：孙威) | Wang, J. P. (Wang, J. P..) | Liu, Z. Y. (Liu, Z. Y..)

Indexed by：

SCIE

Keyword：

electron_microscopy defect complex_structure

Author Community：

[ 1 ] [Sun, W.]Beijing Univ Technol, Inst Microstruct & Property Adv Mat, 100 Pingle Yuan, Beijing 100124, Peoples R China
[ 2 ] [Wang, J. P.]Beijing Univ Technol, Inst Microstruct & Property Adv Mat, 100 Pingle Yuan, Beijing 100124, Peoples R China
[ 3 ] [Liu, Z. Y.]Beijing Univ Technol, Inst Microstruct & Property Adv Mat, 100 Pingle Yuan, Beijing 100124, Peoples R China

Reprint Author's Address：

Email：

weisun@bjut.edu.cn

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Source ：

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES

ISSN： 2053-2733

Year： 2011

Volume： 67

Page： C623-C623

1 . 8 0 0

JCR@2022

ESI Discipline： CHEMISTRY;

Cited Count：

WoS CC Cited Count： 0

SCOPUS Cited Count：

ESI Highly Cited Papers on the List： 0 Unfold All

WanFang Cited Count：

Chinese Cited Count：

30 Days PV： 5

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