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Author:

Zhang, Xin (Zhang, Xin.) | Lu, Qing-mei (Lu, Qing-mei.) | Wang, Lei (Wang, Lei.) | Zhang, Fei-peng (Zhang, Fei-peng.) | Zhang, Jiu-xing (Zhang, Jiu-xing.)

Indexed by:

CPCI-S EI Scopus SCIE

Abstract:

Sn-doped, Mg2Si1-x Sn (x) (x = 0 to 0.6) bulk alloys were prepared using Mg and Sn ingots as raw materials by suspended induction melting combined with the spark plasma sintering method, and the effects of Sn doping on thermoelectric transport properties were studied systematically. The results showed that Mg site vacancies caused by evaporation during the reaction process were filled by excess Mg addition (108 wt.% of the stoichiometric ratio of Mg2Si). The resulting alloy samples were found to be single phase and relatively dense (above 98%). n-Type semiconducting characteristic of Sn-doped Mg2Si1-x Sn (x) alloy was observed, and the electrical resistivity of all samples decreased with increasing temperature. The absolute Seebeck coefficient increased and the thermal conductivity was not changed significantly within the experimental Sn doping range. The dimensionless figure of merit (ZT) for Mg2Si0.4Sn0.6 alloy reached its highest value of 0.25 at 400A degrees C.

Keyword:

Sn doping thermoelectric properties Mg2Si1-xSnx alloys spark plasma sintering

Author Community:

  • [ 1 ] [Zhang, Xin]Beijing Univ Technol, Coll Mat Sci & Engn, Key Lab Adv Funct Mat, Minist Educ, Beijing 100124, Peoples R China
  • [ 2 ] [Lu, Qing-mei]Beijing Univ Technol, Coll Mat Sci & Engn, Key Lab Adv Funct Mat, Minist Educ, Beijing 100124, Peoples R China
  • [ 3 ] [Wang, Lei]Beijing Univ Technol, Coll Mat Sci & Engn, Key Lab Adv Funct Mat, Minist Educ, Beijing 100124, Peoples R China
  • [ 4 ] [Zhang, Fei-peng]Beijing Univ Technol, Coll Mat Sci & Engn, Key Lab Adv Funct Mat, Minist Educ, Beijing 100124, Peoples R China
  • [ 5 ] [Zhang, Jiu-xing]Beijing Univ Technol, Coll Mat Sci & Engn, Key Lab Adv Funct Mat, Minist Educ, Beijing 100124, Peoples R China

Reprint Author's Address:

  • [Zhang, Xin]Beijing Univ Technol, Coll Mat Sci & Engn, Key Lab Adv Funct Mat, Minist Educ, Beijing 100124, Peoples R China

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Source :

JOURNAL OF ELECTRONIC MATERIALS

ISSN: 0361-5235

Year: 2010

Issue: 9

Volume: 39

Page: 1413-1417

2 . 1 0 0

JCR@2022

ESI Discipline: MATERIALS SCIENCE;

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 33

SCOPUS Cited Count: 37

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 8

Online/Total:361/10642553
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