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Abstract:
向Sn3.8Ag0.7Cu无铅焊膏中添加质量分数为1%的Sb金属粉末,研究了其焊点在电流密度为0.34×104 A/cm2、环境温度150 ℃下的电迁移行为.通电245 h后,阴极处钎料基体与Cu6Sn5 IMC之间出现一条平均宽度为16.9 μm的裂纹,阳极界面出现凸起带,钎料基体内部也产生了裂纹.结果表明:1%Sb的添加使焊点形成了SnSb脆性相,在高电流密度和高温环境下产生裂纹,缩短了焊点寿命,降低了电迁移可靠性.
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电子元件与材料
ISSN: 1001-2028
Year: 2008
Issue: 8
Volume: 27
Page: 65-67
Cited Count:
WoS CC Cited Count: 0
SCOPUS Cited Count:
ESI Highly Cited Papers on the List: 0 Unfold All
WanFang Cited Count: 12
Chinese Cited Count:
30 Days PV: 10
Affiliated Colleges: