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Author:

Li, B. (Li, B..) | Yan, P. F. (Yan, P. F..) (Scholars:闫鹏飞) | Sui, M. L. (Sui, M. L..) (Scholars:隋曼龄) | Ma, E. (Ma, E..)

Indexed by:

EI Scopus SCIE

Abstract:

We present transmission electron microscopy (TEM) observations of stacking faults (SFs) and their interactions with pyramidal dislocations, in plastically deformed polycrystalline pure magnesium. We have observed well-defined fringes its well as streaking in diffraction patterns, typical of SFs. The basal SFs are decorated by a large number of dark speckles, which are created by the interaction with pyramidal dislocations that have both < c > and < a > components as revealed by our contrast analysis. The SFs do not appear to result from the splitting of unit dislocations, as the SFs are relatively wide and no dislocation nodes were observed. By tilting the specimen systematically inside TEM, the SFs and the associated dislocations in Mg are found to exhibit a rich variety of features in terms of their morphology and diffraction contrast. (C) 2009 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

Keyword:

Dislocations TEM Stacking fault Magnesium

Author Community:

  • [ 1 ] [Li, B.]Johns Hopkins Univ, Dept Mat Sci & Engn, Baltimore, MD 21218 USA
  • [ 2 ] [Ma, E.]Johns Hopkins Univ, Dept Mat Sci & Engn, Baltimore, MD 21218 USA
  • [ 3 ] [Li, B.]Johns Hopkins Univ, Ctr Adv Metall & Ceram Syst, Baltimore, MD 21218 USA
  • [ 4 ] [Ma, E.]Johns Hopkins Univ, Ctr Adv Metall & Ceram Syst, Baltimore, MD 21218 USA
  • [ 5 ] [Yan, P. F.]Chinese Acad Sci, Inst Met Res, Shenyang, Peoples R China
  • [ 6 ] [Sui, M. L.]Beijing Univ Technol, Inst Microstruct & Property Adv Mat, Beijing 100124, Peoples R China

Reprint Author's Address:

  • [Li, B.]Johns Hopkins Univ, Dept Mat Sci & Engn, Baltimore, MD 21218 USA

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Source :

ACTA MATERIALIA

ISSN: 1359-6454

Year: 2010

Issue: 1

Volume: 58

Page: 173-179

9 . 4 0 0

JCR@2022

ESI Discipline: MATERIALS SCIENCE;

JCR Journal Grade:1

CAS Journal Grade:1

Cited Count:

WoS CC Cited Count: 112

SCOPUS Cited Count: 116

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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