We　have　studied　pyroelectric　and　ferroelectric　properties　of　Pb(Zr,Ti)O(3)　thin　films　grown　epitaxially　on　SrTiO(3)(001)　substrates　by　rf　magnetron　sputtering.　The　pyroelectric　coefficient　was　measured　in　the　temperature　range　from　280　to　370　K　using　the　Byer-Roundy　method.　Values　as　high　as　48　nC/cm(2)　K　have　been　obtained　at　300　K.　The　PZT　thin　films　exhibited　a　remanent　polarization　of　45-58　mu　C/cm(2).　The　improved　pyroelectric　coefficient　was　attributed　to　a　high　crystalline　quality　of　the　films,　as　revealed　by　x-ray　diffraction　that　showed　only　(001)-oriented　perovskite　PZT　phase　and　a　omega-rocking　curve　full　width　at　half　maximum　value　as　low　as　4.2　arc　min　for　300　nm　thick　films.