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Author:

Xu, Dong-Xia (Xu, Dong-Xia.) | Lei, Yong-Ping (Lei, Yong-Ping.) (Scholars:雷永平) | Xia, Zhi-Dong (Xia, Zhi-Dong.) | Guo, Fu (Guo, Fu.) (Scholars:郭福) | Shi, Yao-Wu (Shi, Yao-Wu.)

Indexed by:

CPCI-S EI Scopus SCIE

Abstract:

The selection of soldering flux plays a critical role in promoting wetting and product reliability of printed circuit board assemblies. In this study, the effects of fluxes on the wetting characteristics of the Sn-3.0Ag-0.5Cu solder alloy on Cu substrates was researched by using various flux systems at different soldering temperatures. Because of the distinct characteristic of the lead-free solder-poor wettability-three kinds of fluxes [no-clean flux with high solid content (NCF), rosin mildly activated flux (RMA) and water-soluble flux (WSF)] were chosen for the wetting experiments. The wetting time and force were the evaluating indicators. The experimental observations indicated that the wettability clearly depended on the soldering temperature and flux system when using the same solder. Furthermore, the corrosion potential of flux residues was measured by surface insulation resistance (SIR) testing. Scanning electron microscope (SEM) and energy-dispersive X-ray spectroscopy (EDS) were used to determine the contents of the flux residues and corrosion products.

Keyword:

soldering flux surface insulation resistance (SIR) wettability lead-free solder

Author Community:

  • [ 1 ] [Xu, Dong-Xia]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100022, Peoples R China
  • [ 2 ] [Lei, Yong-Ping]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100022, Peoples R China
  • [ 3 ] [Xia, Zhi-Dong]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100022, Peoples R China
  • [ 4 ] [Guo, Fu]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100022, Peoples R China
  • [ 5 ] [Shi, Yao-Wu]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100022, Peoples R China

Reprint Author's Address:

  • [Xu, Dong-Xia]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100022, Peoples R China

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Source :

JOURNAL OF ELECTRONIC MATERIALS

ISSN: 0361-5235

Year: 2008

Issue: 1

Volume: 37

Page: 125-133

2 . 1 0 0

JCR@2022

ESI Discipline: MATERIALS SCIENCE;

JCR Journal Grade:2

Cited Count:

WoS CC Cited Count: 17

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 5

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