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Author:

Wang, Y. (Wang, Y..) | Mei, Z. X. (Mei, Z. X..) | Yuan, H. T. (Yuan, H. T..) | Du, X. L. (Du, X. L..) (Scholars:杜修力) | Zou, J. (Zou, J..) | Jia, J. F. (Jia, J. F..) (Scholars:贾俊峰) | Xue, Q. K. (Xue, Q. K..) | Zhang, Z. (Zhang, Z..)

Indexed by:

EI Scopus SCIE

Abstract:

An improved MBE-grown ZnO film on nitrided sapphire was obtained by introducing an MgO buffer layer before the ZnO growth. The effect of MgO layer was systematically studied by transmission electron microscopy investigations. It was found that the island feature of MgO buffer promoted the strain relaxation of the nitrided layer, which, in turn, improved the quality of the ZnO film. (c) 2007 Elsevier B.V. All rights reserved.

Keyword:

characterization interfaces defects molecular beam epitaxy semiconducting II-VI materials

Author Community:

  • [ 1 ] Chinese Acad Sci, Inst Phys, Beijing Natl Lab Condensed Matter Phys, Beijing 100080, Peoples R China
  • [ 2 ] Univ Queensland, Sch Engn, St Lucia, Qld 4072, Australia
  • [ 3 ] Univ Queensland, Ctr Microscopy & Microanal, St Lucia, Qld 4072, Australia
  • [ 4 ] Tsing Hua Univ, Dept Phys, Beijing 100084, Peoples R China
  • [ 5 ] Beijing Univ Technol, Beijing, Peoples R China

Reprint Author's Address:

  • [Zou, J.]Chinese Acad Sci, Inst Phys, Beijing Natl Lab Condensed Matter Phys, Beijing 100080, Peoples R China

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Source :

JOURNAL OF CRYSTAL GROWTH

ISSN: 0022-0248

Year: 2007

Issue: 1

Volume: 305

Page: 74-77

1 . 8 0 0

JCR@2022

ESI Discipline: CHEMISTRY;

JCR Journal Grade:2

Cited Count:

WoS CC Cited Count: 8

SCOPUS Cited Count: 8

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 10

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