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Author:

贾云鹏 (贾云鹏.) | 亢宝位 (亢宝位.) | 吴郁 (吴郁.) | 吴鹤 (吴鹤.)

Indexed by:

CQVIP PKU CSCD

Abstract:

对应用于高压功率器件的寿命控制技术进行了述评.着重分析了高能H+辐照、He2+辐照等局域寿命控制技术,利用这种技术有可能实现高压功率器件突破性的进展.

Keyword:

轻离子辐照 半导体元器件/寿命控制技术 半导体

Author Community:

  • [ 1 ] [贾云鹏]北京工业大学
  • [ 2 ] [亢宝位]北京工业大学
  • [ 3 ] [吴郁]北京工业大学
  • [ 4 ] [吴鹤]北京工业大学

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Source :

电力电子技术

ISSN: 1000-100X

Year: 2003

Issue: 6

Volume: 37

Page: 89-91

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count: 18

Chinese Cited Count:

30 Days PV: 12

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