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Author:

Yu, HP (Yu, HP.) | Sui, YK (Sui, YK.) | Wang, J (Wang, J.) | Zhang, FQ (Zhang, FQ.) | Dai, XL (Dai, XL.)

Indexed by:

SCIE

Abstract:

Concepts and techniques of response surface methodology have been widely applied in many branches of engineering, especially in the chemical and manufacturing areas. This paper presents an application of the methodology in a magnetic crystal Czochralski growth system for single crystal silicon to optimize the oxygen concentration at the crystal growth interface in a cusp magnetic field. The simulation demonstrates that the response surface methodology is a feasible algorithm for the optimization of the Czochralski crystal growth process.

Keyword:

magnetic field response surface methodology Czochralski optimization

Author Community:

  • [ 1 ] Beijing Univ Technol, Numer Simulat Ctr Engn, Beijing 100022, Peoples R China
  • [ 2 ] Gen Res Inst NonFerrous Met, Beijing 100088, Peoples R China

Reprint Author's Address:

  • [Yu, HP]Beijing Univ Technol, Numer Simulat Ctr Engn, Beijing 100022, Peoples R China

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Source :

JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY

ISSN: 1005-0302

Year: 2006

Issue: 2

Volume: 22

Page: 173-178

1 0 . 9 0 0

JCR@2022

ESI Discipline: MATERIALS SCIENCE;

JCR Journal Grade:3

Cited Count:

WoS CC Cited Count: 5

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 4

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